Instrumental specification for energy dispersive X-ray spectrometers with semiconductor detectors

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GB/T 20726-2006 Instrumental specification for energy dispersive X-ray spectrometers with semiconductor detectors
Standard No.:	GB/T 20726-2006	Status:	ABOLISHED remind me the status change Email:
Language:	English	File Format:	PDF
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Implemented on:	2007-08-01	Delivery:	via email in 1-3 business day
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Standard No.:	GB/T 20726-2006
Chinese Name:	半导体探测器X射线能谱仪通则
English Name:	Instrumental specification for energy dispersive X-ray spectrometers with semiconductor detectors
Professional Classification:	N33 Electron optics and other physical optics instrument
Professional Classification:	GB National Standard
ICS Classification:	71.040.99 Other standards related to analytical chemistry
Issued by:
Issued on:	2006-12-25
Implemented on:	2007-08-01
Status:	ABOLISHED
Replace By:	GB/T20726-2015 Microbeam analysis—Selected instrumental performance parameters for the specification and checking of energy dispersive X-ray spectrometers for use in electron probe microanalysis
Replace By Date:	2016-09-01
Language:	English
File Format:	PDF
Word Count:
Price(USD):	please email coc@codeofchina.com for quotation
Delivery:	via email in 1-3 business day

GB/T 20726-2006 The following standards are cited：

GB/T 20726-2006 Cited by the following standards：

*GB/T 20726-2006 Instrumental specification for energy dispersive X-ray spectrometers with semiconductor detectors

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