Semiconductor devices - Mechanical and climatic test methods - Part 4: Damp heat, steady state, highly accelerated stress test (HAST)

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GB/T 4937.4-2012 Semiconductor devices - Mechanical and climatic test methods - Part 4: Damp heat, steady state, highly accelerated stress test (HAST)
Standard No.:	GB/T 4937.4-2012	Status:	VALID remind me the status change Email:
Language:	English	File Format:	PDF
Word Count:	4000 words	Price(USD):	(USD) remind me the price change Email:
Implemented on:	2013-02-15	Delivery:	via email in 1 business day
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Standard No.:	GB/T 4937.4-2012
Chinese Name:	半导体器件机械和气候试验方法第4部分：强加速稳态湿热试验（HAST）
English Name:	Semiconductor devices - Mechanical and climatic test methods - Part 4: Damp heat, steady state, highly accelerated stress test (HAST)
Professional Classification:	L40 Semiconductor discrete devices in general
Professional Classification:	GB National Standard
ICS Classification:	31.080.01 Semiconductor devices in general
Issued by:	AQSIQ,SAC
Issued on:	2012-11-05
Implemented on:	2013-02-15
Status:	VALID
Language:	English
File Format:	PDF
Word Count:	4000 words
Price(USD):	(USD)
Delivery:	via email in 1 business day

GB/T 4937.4-2012 The following standards are cited：

GB/T 4937.4-2012 Cited by the following standards：

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