Test methods for properties of structure ceramic used in electronic components; Test method for dielectric loss angle tangent value

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GB 5594.4-1985 Test methods for properties of structure ceramic used in electronic components; Test method for dielectric loss angle tangent value
Standard No.:	GB 5594.4-1985	Status:	ABOLISHED remind me the status change Email:
Language:	English	File Format:	PDF
Word Count:	2000 words	Price(USD):	60 (USD) remind me the price change Email:
Implemented on:	1986-12-01	Delivery:	via email in 1-3 business day
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Standard No.:	GB 5594.4-1985
Chinese Name:	电子元器件结构陶瓷材料性能测试方法介质损耗角正切值的测试方法
English Name:	Test methods for properties of structure ceramic used in electronic components; Test method for dielectric loss angle tangent value
Professional Classification:	GB National Standard
Issued by:
Issued on:	1985-11-27
Implemented on:	1986-12-01
Status:	ABOLISHED
Replace By:	GB/T5594.4-2015 Test methods for properties of structure ceramic used in electronic component and device — Part 4: Test method for permittivity and dielectric loss angle tangent value
Replace By Date:	2016-01-01
Language:	English
File Format:	PDF
Word Count:	2000 words
Price(USD):	60 (USD)
Delivery:	via email in 1-3 business day

GB 5594.4-1985 The following standards are cited：

GB 5594.4-1985 Cited by the following standards：

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