Measurement procedures for semiconductor X-ray detector system and semiconductor X-ray energy spectrometers

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GB/T 11685-2003 Measurement procedures for semiconductor X-ray detector system and semiconductor X-ray energy spectrometers
Standard No.:	GB/T 11685-2003	Status:	VALID remind me the status change Email:
Language:	English	File Format:	PDF
Word Count:	13000 words	Price(USD):	(USD) remind me the price change Email:
Implemented on:	2004-01-01	Delivery:	via email in 1-3 business day
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Standard No.:	GB/T 11685-2003
Chinese Name:	半导体X射线探测器系统和半导体X射线能谱仪的测量方法
English Name:	Measurement procedures for semiconductor X-ray detector system and semiconductor X-ray energy spectrometers
Professional Classification:	F80 Nuclear instrument and detector in general
Professional Classification:	GB National Standard
ICS Classification:	27.120.01 Nuclear energy in general
Issued by:
Issued on:	2003-07-07
Implemented on:	2004-01-01
Status:	VALID
Language:	English
File Format:	PDF
Word Count:	13000 words
Price(USD):	(USD)
Delivery:	via email in 1-3 business day

GB/T 11685-2003 The following standards are cited：

GB/T 11685-2003 Cited by the following standards：

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