Silicon slices and wafers-Measuring of diameter-Micrometer method

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GB/T 14140.2-1993 Silicon slices and wafers-Measuring of diameter-Micrometer method
Standard No.:	GB/T 14140.2-1993	Status:	ABOLISHED remind me the status change Email:
Language:	English	File Format:	PDF
Word Count:	1500 words	Price(USD):	45 (USD) remind me the price change Email:
Implemented on:	1993-10-01	Delivery:	via email in 1-3 business day
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Standard No.:	GB/T 14140.2-1993
Chinese Name:	硅片直径测量方法千分尺法
English Name:	Silicon slices and wafers-Measuring of diameter-Micrometer method
Professional Classification:	H81 Semimetal
Professional Classification:	GB National Standard
ICS Classification:	77.040.01 Testing of metals in general
Issued by:
Issued on:	1993-02-06
Implemented on:	1993-10-01
Status:	ABOLISHED
Replace By:	GB/T14140-2009 Test method for measuring diameter of semiconductor wafer
Replace By Date:	2010-06-01
Language:	English
File Format:	PDF
Word Count:	1500 words
Price(USD):	45 (USD)
Delivery:	via email in 1-3 business day

GB/T 14140.2-1993 The following standards are cited：

GB/T 14140.2-1993 Cited by the following standards：

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