Test method for stacking fault density of epitaxial layers of silicon by interference contrast microscopy

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GB/T 14145-1993 Test method for stacking fault density of epitaxial layers of silicon by interference contrast microscopy
Standard No.:	GB/T 14145-1993	Status:	ABOLISHED remind me the status change Email:
Language:	English	File Format:	PDF
Word Count:	2000 words	Price(USD):	180 (USD) remind me the price change Email:
Implemented on:	1993-10-01	Delivery:	via email in 1 business day
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Standard No.:	GB/T 14145-1993
Chinese Name:	硅外延层堆垛层错密度测定干涉相衬显微镜法
English Name:	Test method for stacking fault density of epitaxial layers of silicon by interference contrast microscopy
Professional Classification:	H24 Metallographic testing method
Professional Classification:	GB National Standard
Issued by:	SBTS
Issued on:	1993-02-06
Implemented on:	1993-10-01
Status:	ABOLISHED
Language:	English
File Format:	PDF
Word Count:	2000 words
Price(USD):	180 (USD)
Delivery:	via email in 1 business day

GB/T 14145-1993 The following standards are cited：

GB/T 14145-1993 Cited by the following standards：

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