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GB/T 17473.6-1998 Test methods of precious metal pastes used for thick film microelectronics--Determination of resolution
Standard No.: GB/T 17473.6-1998 Status: ABOLISHED remind me the status change
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Implemented on: 1999-03-01 Delivery: via email in 1-3 business day
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Standard No.: GB/T 17473.6-1998
Chinese Name: 厚膜微电子技术用贵金属浆料测试方法 分辨率测定
English Name: Test methods of precious metal pastes used for thick film microelectronics--Determination of resolution
Professional Classification: H23 Metal processing property test method
Professional Classification: GB National Standard
ICS Classification: 77.040.01 Testing of metals in general
Issued by:
Issued on: 1998-08-19
Implemented on: 1999-03-01
Status: ABOLISHED
Replace By:GB/T17473.6-2008 Test methods of precious metal pastes used for microelectronics - Determination of resolution
Replace By Date:2008-09-01
Language: English
File Format: PDF
Word Count:
Price(USD): please email coc@codeofchina.com for quotation
Delivery: via email in 1-3 business day
GB/T 17473.6-1998 The following standards are cited:
GB/T 17473.6-1998 Cited by the following standards:
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