Test methods of precious metal pastes used for thick film microelectronics--Determination of resolution

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GB/T 17473.6-1998 Test methods of precious metal pastes used for thick film microelectronics--Determination of resolution
Standard No.:	GB/T 17473.6-1998	Status:	ABOLISHED remind me the status change Email:
Language:	English	File Format:	PDF
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Implemented on:	1999-03-01	Delivery:	via email in 1-3 business day
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Standard No.:	GB/T 17473.6-1998
Chinese Name:	厚膜微电子技术用贵金属浆料测试方法分辨率测定
English Name:	Test methods of precious metal pastes used for thick film microelectronics--Determination of resolution
Professional Classification:	H23 Metal processing property test method
Professional Classification:	GB National Standard
ICS Classification:	77.040.01 Testing of metals in general
Issued by:
Issued on:	1998-08-19
Implemented on:	1999-03-01
Status:	ABOLISHED
Replace By:	GB/T17473.6-2008 Test methods of precious metal pastes used for microelectronics - Determination of resolution
Replace By Date:	2008-09-01
Language:	English
File Format:	PDF
Word Count:
Price(USD):	please email coc@codeofchina.com for quotation
Delivery:	via email in 1-3 business day

GB/T 17473.6-1998 The following standards are cited：

GB/T 17473.6-1998 Cited by the following standards：

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