Surface chemical analysis - Secondary-ion mass spectrometry - Method for estimating depth resolution parameters with multiple delta-layer reference materials

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GB/T 22572-2008 Surface chemical analysis - Secondary-ion mass spectrometry - Method for estimating depth resolution parameters with multiple delta-layer reference materials
Standard No.:	GB/T 22572-2008	Status:	VALID remind me the status change Email:
Language:	English	File Format:	PDF
Word Count:	4000 words	Price(USD):	120 (USD) remind me the price change Email:
Implemented on:	2009-10-01	Delivery:	via email in 1-3 business day
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Standard No.:	GB/T 22572-2008
Chinese Name:	表面化学分析二次离子质谱用多δ层参考物质评估深度分辨参数的方法
English Name:	Surface chemical analysis - Secondary-ion mass spectrometry - Method for estimating depth resolution parameters with multiple delta-layer reference materials
Professional Classification:	G04 Basic standards and general methods
Professional Classification:	GB National Standard
ICS Classification:	71.040.40 Chemical analysis
Issued by:
Issued on:	2008-12-11
Implemented on:	2009-10-01
Status:	VALID
Language:	English
File Format:	PDF
Word Count:	4000 words
Price(USD):	120 (USD)
Delivery:	via email in 1-3 business day

GB/T 22572-2008 The following standards are cited：

GB/T 22572-2008 Cited by the following standards：

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