Standard No.:	GB/T 27760-2011
Chinese Name:	利用Si（111）晶面原子台阶对原子力显微镜亚纳米高度测量进行校准的方法
English Name:	Test method for calibrating the z-magnification of an atomic force microscope at subnanometer displacement levels using Si(111) monatomic step
Professional Classification:	N04 Basic standards and general methods
ICS Classification:	19.020
Issued by:
Issued on:	2011-12-30
Implemented on:	2012-05-01
Status:	VALID
Language:	English
File Format:	PDF
Word Count:	8000 words
Price(USD):	240 (USD)
Delivery:	via email in 1-3 business day

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