Surface chemical analysis—Chemical methods for the collection of elements from the surface of silicon-wafer working reference materials and their determination by total-reflection X-ray fluorescence(TXRF) spectroscopy

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GB/T 30701-2014 Surface chemical analysis—Chemical methods for the collection of elements from the surface of silicon-wafer working reference materials and their determination by total-reflection X-ray fluorescence(TXRF) spectroscopy
Standard No.:	GB/T 30701-2014	Status:	VALID remind me the status change Email:
Language:	English	File Format:	PDF
Word Count:	12000 words	Price(USD):	360 (USD) remind me the price change Email:
Implemented on:	2014-12-01	Delivery:	via email in 1-3 business day
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Standard No.:	GB/T 30701-2014
Chinese Name:	表面化学分析硅片工作标准样品表面元素的化学收集方法和全反射X射线荧光光谱法(TXRF)测定
English Name:	Surface chemical analysis—Chemical methods for the collection of elements from the surface of silicon-wafer working reference materials and their determination by total-reflection X-ray fluorescence(TXRF) spectroscopy
Professional Classification:	G04 Basic standards and general methods
Professional Classification:	GB National Standard
ICS Classification:	71.040.40 Chemical analysis
Issued by:
Issued on:	2014-06-09
Implemented on:	2014-12-01
Status:	VALID
Language:	English
File Format:	PDF
Word Count:	12000 words
Price(USD):	360 (USD)
Delivery:	via email in 1-3 business day

GB/T 30701-2014 The following standards are cited：

GB/T 30701-2014 Cited by the following standards：

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