Nondestructive test method for micropipe density of polished monocrystalline silicon carbide wafers

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GB/T 31351-2014 Nondestructive test method for micropipe density of polished monocrystalline silicon carbide wafers
Standard No.:	GB/T 31351-2014	Status:	VALID remind me the status change Email:
Language:	English	File Format:	PDF
Word Count:	4000 words	Price(USD):	120 (USD) remind me the price change Email:
Implemented on:	2015-09-01	Delivery:	via email in 1-3 business day
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Standard No.:	GB/T 31351-2014
Chinese Name:	碳化硅单晶抛光片微管密度无损检测方法
English Name:	Nondestructive test method for micropipe density of polished monocrystalline silicon carbide wafers
Professional Classification:	H26 Metal nondestructive testing method
Professional Classification:	GB National Standard
ICS Classification:	77.040.99 Other methods of testing of metals
Issued by:
Issued on:	2014-12-31
Implemented on:	2015-09-01
Status:	VALID
Language:	English
File Format:	PDF
Word Count:	4000 words
Price(USD):	120 (USD)
Delivery:	via email in 1-3 business day

GB/T 31351-2014 The following standards are cited：

GB/T 31351-2014 Cited by the following standards：

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