Extrinsic semiconductor single crystals; Measurement of Hall mobility and Hall coefficient

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GB/T 4326-1984 Extrinsic semiconductor single crystals; Measurement of Hall mobility and Hall coefficient
Standard No.:	GB/T 4326-1984	Status:	ABOLISHED remind me the status change Email:
Language:	English	File Format:	PDF
Word Count:	5500 words	Price(USD):	165 (USD) remind me the price change Email:
Implemented on:	1985-03-01	Delivery:	via email in 1-3 business day
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Standard No.:	GB/T 4326-1984
Chinese Name:	非本征半导体单晶霍尔迁移率和霍尔系数测量方法
English Name:	Extrinsic semiconductor single crystals; Measurement of Hall mobility and Hall coefficient
Professional Classification:	H21 Metal physical property test method
Professional Classification:	GB National Standard
Issued by:
Issued on:	1984-04-12
Implemented on:	1985-03-01
Status:	ABOLISHED
Replace By:	GB/T4326-2006 Extrinsic semiconductor single crystals measurement of Hall mobility and Hall coefficient
Replace By Date:	2006-11-01
Language:	English
File Format:	PDF
Word Count:	5500 words
Price(USD):	165 (USD)
Delivery:	via email in 1-3 business day

GB/T 4326-1984 The following standards are cited：

GB/T 4326-1984 Cited by the following standards：

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