Test method for thickness and total thickness variation of silicon slices

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GB/T 6618-1995 Test method for thickness and total thickness variation of silicon slices
Standard No.:	GB/T 6618-1995	Status:	ABOLISHED remind me the status change Email:
Language:	English	File Format:	PDF
Word Count:		Price(USD):	please email coc@codeofchina.com for quotation remind me the price change Email:
Implemented on:	1995-01-02	Delivery:	via email in 1-3 business day
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Standard No.:	GB/T 6618-1995
Chinese Name:	硅片厚度和总厚度变化测试方法
English Name:	Test method for thickness and total thickness variation of silicon slices
Professional Classification:	H21 Metal physical property test method
Professional Classification:	GB National Standard
Issued by:
Issued on:	1995-04-18
Implemented on:	1995-01-02
Status:	ABOLISHED
Replace:	GB6618-1986 Standard method for measuring thickness and total thickness variation of silicon slices
Replace By:	GB/T6618-2009 Test method for thickness and total thickness variation of silicon slices
Replace By Date:	2010-06-01
Language:	English
File Format:	PDF
Word Count:
Price(USD):	please email coc@codeofchina.com for quotation
Delivery:	via email in 1-3 business day

GB/T 6618-1995 The following standards are cited：

GB/T 6618-1995 Cited by the following standards：

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