Test method of surface defect for photoconductor of electrostatic copying process

JB/T 8268-2015 Test method of surface defect for photoconductor of electrostatic copying process
Standard No.:	JB/T 8268-2015	Status:	VALID remind me the status change Email:
Target Language:	English	File Format:	PDF
Word Count:		Translation Price:	please email coc@codeofchina.com for quotation remind me the price change Email:
Implemented on:	2015-10-01	Delivery:	via email in
Purchase steps: 1 - Add shopping cart → 2 - My shopping cart → 3 - Login → 4 - Invoice information → 5 - Checkout

Standard No.:	JB/T 8268-2015
Chinese Name:	静电复印光导体表面缺陷测量方法
English Name:	Test method of surface defect for photoconductor of electrostatic copying process
Professional Classification:	N47 Micro and copier machinery
Professional Classification:	JB Professional Standard - Machinery
ICS Classification:	37.100.10 Reproduction equipment
Issued by:
Issued on:	2015-04-30
Implemented on:	2015-10-01
Status:	VALID
Replace:	JB/T8268-1999 Standard test method for surface defect of photoconductor for electrostatic process
Target Language:	English
File Format:	PDF
Word Count:
Translation Price:	please email coc@codeofchina.com for quotation
Delivery:	via email in

JB/T 8268-2015 The following standards are cited：

JB/T 8268-2015 Cited by the following standards：