This standard specifies the qualitative analysis and quantitative analysis for the phase composition of various polycrystalline materials with polycrystal X-ray diffractometer under room temperature, high and low temperature, the determination of granular size (about 1~200nm) and intragranular lattice distortion and the general determination method for the lattice constant of crystals in cubic system.
This standard is applicable to various polycrystal materials, like metal, alloy, mineral, soil, ceramic, building material, organic and inorganic compound, medicine, polymer and environmentally-friendly specimen. It is primarily applicable to diffractometer method. However, photographic method may be applied by reference.
