Thermal resistance measurements of sinks for semiconductor devices under natural air cooling conditions

SJ 1267-1977 Thermal resistance measurements of sinks for semiconductor devices under natural air cooling conditions
Standard No.:	SJ 1267-1977	Status:	VALID remind me the status change Email:
Target Language:	English	File Format:	PDF
Word Count:	3000 words	Translation Price:	90 (USD) remind me the price change Email:
Implemented on:	1978-01-01	Delivery:	via email in 1 business day
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Standard No.:	SJ 1267-1977
Chinese Name:	半导体器件用散热器在自然空气冷却状态下的热阻测试方法
English Name:	Thermal resistance measurements of sinks for semiconductor devices under natural air cooling conditions
Professional Classification:	J01 Technical management
Professional Classification:	SJ Professional Standard - Electronics
Issued by:
Issued on:	1977-12-26
Implemented on:	1978-01-01
Status:	VALID
Target Language:	English
File Format:	PDF
Word Count:	3000 words
Translation Price:	90 (USD)
Delivery:	via email in 1 business day

SJ 1267-1977 The following standards are cited：

SJ 1267-1977 Cited by the following standards：