Method of analysis by emission spectrum of impurities in Titanium dioxide for use in electronic ceramics

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SJ 2320-1983 Method of analysis by emission spectrum of impurities in Titanium dioxide for use in electronic ceramics
Standard No.:	SJ 2320-1983	Status:	ABOLISHED remind me the status change Email:
Language:	English	File Format:	PDF
Word Count:	1500 words	Price(USD):	45 (USD) remind me the price change Email:
Implemented on:	1988-06-01	Delivery:	via email in 1-3 business day
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Standard No.:	SJ 2320-1983
Chinese Name:	电子陶瓷用二氧化钛中杂质的发射光谱分析方法
English Name:	Method of analysis by emission spectrum of impurities in Titanium dioxide for use in electronic ceramics
Professional Classification:	L90 Special electronic technology material
Professional Classification:	SJ Professional Standard - Electronics
Issued by:
Issued on:
Implemented on:	1988-06-01
Status:	ABOLISHED
Replace By:	SJ/T10552-1994 Method of emission specthochemical analysis of impurities in TiO2 for use in electron ceramics
Replace By Date:	1994-12-01
Language:	English
File Format:	PDF
Word Count:	1500 words
Price(USD):	45 (USD)
Delivery:	via email in 1-3 business day

SJ 2320-1983 The following standards are cited：

SJ 2320-1983 Cited by the following standards：

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