General procedures of measurement for electrical and optical parameters of PIN and avalanche photodiodes

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SJ 2354.1-1983 General procedures of measurement for electrical and optical parameters of PIN and avalanche photodiodes
Standard No.:	SJ 2354.1-1983	Status:	ABOLISHED remind me the status change Email:
Language:	English	File Format:	PDF
Word Count:	1000 words	Price(USD):	184 (USD) remind me the price change Email:
Implemented on:	1984-07-01	Delivery:	via email in 1 business day
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Standard No.:	SJ 2354.1-1983
Chinese Name:	ＰＩＮ、雪崩光电二极管光电参数测试方法总则
English Name:	General procedures of measurement for electrical and optical parameters of PIN and avalanche photodiodes
Professional Classification:	F01 Technical management
Professional Classification:	SJ Professional Standard - Electronics
Issued by:	MOEI
Issued on:	1983-08-15
Implemented on:	1984-07-01
Status:	ABOLISHED
Replace By:	SJ/T 2354-2015
Replace By Date:
Language:	English
File Format:	PDF
Word Count:	1000 words
Price(USD):	184 (USD)
Delivery:	via email in 1 business day

SJ 2354.1-1983 The following standards are cited：

SJ 2354.1-1983 Cited by the following standards：

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