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SJ 3244.2-1989 Methods of measurement for crystal lattice mismatch between substrate of Gallium arsenide and Indium phosphide and extended layer of heterojunction
Standard No.: SJ 3244.2-1989 Status: remind me the status change
Target Language: English File Format: PDF
Word Count: 2500 words Translation Price: 75 (USD) remind me the price change
Implemented on: 1989-03-25 Delivery: via email in 1-3 business day
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Standard No.: SJ 3244.2-1989
Chinese Name: 砷化镓、磷化铟衬底与异质结外延层之间晶格失配的测量方法
English Name: Methods of measurement for crystal lattice mismatch between substrate of Gallium arsenide and Indium phosphide and extended layer of heterojunction
Professional Classification: A01 Technical Management
Professional Classification: SJ Professional Standard - Electronics
Issued by:
Issued on: 1989-03-20
Implemented on: 1989-03-25
Status:
Target Language: English
File Format: PDF
Word Count: 2500 words
Translation Price: 75 (USD)
Delivery: via email in 1-3 business day
SJ 3244.2-1989 The following standards are cited：
SJ 3244.2-1989 Cited by the following standards：
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