Methods of measurement for profile distribution of carrier concentration of Gallium arsenide and Indium phosphide materials-Electrochemical voltage capacitance method

SJ 3244.4-1989 Methods of measurement for profile distribution of carrier concentration of Gallium arsenide and Indium phosphide materials-Electrochemical voltage capacitance method
Standard No.:	SJ 3244.4-1989	Status:	remind me the status change Email:
Target Language:	English	File Format:	PDF
Word Count:	2500 words	Translation Price:	75 (USD) remind me the price change Email:
Implemented on:	1989-03-25	Delivery:	via email in 1-3 business day
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Standard No.:	SJ 3244.4-1989
Chinese Name:	砷化镓和磷化铟材料载流子浓度剖面分布的测试方法－电化学电压电容法
English Name:	Methods of measurement for profile distribution of carrier concentration of Gallium arsenide and Indium phosphide materials-Electrochemical voltage capacitance method
Professional Classification:	A01 Technical Management
Professional Classification:	SJ Professional Standard - Electronics
Issued by:
Issued on:	1989-03-20
Implemented on:	1989-03-25
Status:
Target Language:	English
File Format:	PDF
Word Count:	2500 words
Translation Price:	75 (USD)
Delivery:	via email in 1-3 business day

SJ 3244.4-1989 The following standards are cited：

SJ 3244.4-1989 Cited by the following standards：