Methods of measurement for resistivity of semi-insulation Gallium arsenide and Indium phosphide single crystal material

SJ 3249.1-1989 Methods of measurement for resistivity of semi-insulation Gallium arsenide and Indium phosphide single crystal material
Standard No.:	SJ 3249.1-1989	Status:	remind me the status change Email:
Target Language:	English	File Format:	PDF
Word Count:	4000 words	Translation Price:	120 (USD) remind me the price change Email:
Implemented on:	1989-03-25	Delivery:	via email in 1-3 business day
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Standard No.:	SJ 3249.1-1989
Chinese Name:	半绝缘砷化镓和磷化铟体单晶材料的电阻率测试方法
English Name:	Methods of measurement for resistivity of semi-insulation Gallium arsenide and Indium phosphide single crystal material
Professional Classification:	A01 Technical Management
Professional Classification:	SJ Professional Standard - Electronics
Issued by:
Issued on:	1989-03-20
Implemented on:	1989-03-25
Status:
Target Language:	English
File Format:	PDF
Word Count:	4000 words
Translation Price:	120 (USD)
Delivery:	via email in 1-3 business day

SJ 3249.1-1989 The following standards are cited：

SJ 3249.1-1989 Cited by the following standards：