Measurement of quartz crystal unit parameters Part 4: Method for the measurement of the load resonance frequency fl, load resonance resistance Rl and the calculation of other derived v

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SJ/T 11210-1999 Measurement of quartz crystal unit parameters Part 4: Method for the measurement of the load resonance frequency fl, load resonance resistance Rl and the calculation of other derived v
Standard No.:	SJ/T 11210-1999	Status:	VALID remind me the status change Email:
Language:	English	File Format:	PDF
Word Count:	6000 words	Price(USD):	(USD) remind me the price change Email:
Implemented on:	1999-12-01	Delivery:	via email in 1 business day
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Standard No.:	SJ/T 11210-1999
Chinese Name:	石英晶体元件参数的测量第4部分：频率达30MHz石英晶体元件负载谐振频率fL和负载谐振电阻RL的测量方法及其他导出参数的计算
English Name:	Measurement of quartz crystal unit parameters Part 4: Method for the measurement of the load resonance frequency fl, load resonance resistance Rl and the calculation of other derived v
Professional Classification:	L21 Quartz crystal and piezoelectric element
Professional Classification:	SJ Professional Standard - Electronics
Issued by:	MIIT
Issued on:	1999-08-26
Implemented on:	1999-12-01
Status:	VALID
Language:	English
File Format:	PDF
Word Count:	6000 words
Price(USD):	(USD)
Delivery:	via email in 1 business day

SJ/T 11210-1999 The following standards are cited：

SJ/T 11210-1999 Cited by the following standards：

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