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Standard No. Title Price(USD) Delivery Status Add To Cart
YS/T 792-2012 Carbon-carbon composites crucible used in single crystal furnace (USD) via email in 1-3 business day VALID
GB/T 12964-1996 Monocrystalline silicon polished wafers (USD) via email in 1-3 business day ABOLISHED
GB/T 14141-2009 Test method for sheet resistance of silicon epitaxial,diffused and ion-implanted layers using a collinear four-probe array (USD) via email in 1-3 business day VALID
GB/T 11094-2007 Horizontal bridgman grown gallium arsenide single crystal and cutting wafer (USD) via email in 1-3 business day VALID
GB/T 1558-1997 Test method for substitutional atomic carbon content of silicon by infrared absorption via email in 1-3 business day ABOLISHED please email coc@codeofchina.com for quotation
GB/T 13388-2009 Method for measuring crystallographic orientation of flats on single-crystal silicon slices and wafers by X-ray techniques (USD) via email in 1-3 business day VALID
GB/T 14144-2009 Testing method for determination of radial interstitial oxygen variation in silicon (USD) via email in 1-3 business day VALID
GB/T 26072-2010 Germanium single crystal for solar cell (USD) via email in 1-3 business day VALID
YS/T 988-2014 Carboxyethyl-germanium sesquioxide (USD) via email in 1 business day VALID
GB/T 24582-2009 Test method for measuring surface metal contamination of polycrystalline silicon by acid extraction-inductively coupled plasma mass spectrometry (USD) via email in 1-3 business day VALID
GB/T 6618-2009 Test method for thickness and total thickness variation of silicon slices (USD) via email in 1-3 business day VALID
GB/T 29850-2013 Test method for measuring compensation degree of silicon materials used for photovoltaic applications (USD) via email in 1-3 business day VALID
GB/T 29057-2012 Practice for evaluation of polocrystalline silicon rods by float-zone crystal growth and spectroscopy (USD) via email in 1-3 business day VALID
GB/T 29849-2013 Test method for measuring surface metallic contamination of silicon materials used for photovoltaic applications by inductively coupled plasma mass spectrometry (USD) via email in 1-3 business day VALID
GB/T 29508-2013 300 mm monocrystalline silicon as cut slices and grinded slices (USD) via email in 1-3 business day VALID
GB/T 32279-2015 Specification for order entry format of silicon wafers (USD) via email in 1-3 business day VALID
YS/T 13-2015 (USD) via email in 1-3 business day VALID
YS/T 989-2014 Germanium grain (USD) via email in 1-3 business day VALID
GB/T 34479-2017 Specification for alphanumeric marking of silicon wafers (USD) via email in 1-3 business day VALID
GB/T 16596-1996 Specification for establishing a wafer coordinate system via email in 1-3 business day ABOLISHED please email coc@codeofchina.com for quotation
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