| Standard No. |
Title |
Price(USD) |
Delivery |
Status |
Add To Cart |
| GB/T 6624-2009 |
Standard method for measuring the surface quality of polished silicon slices by visual inspection |
|
via email in
|
VALID
|
please email coc@codeofchina.com for quotation
|
| GB/T 29055-2019 |
Multicrystalline silicon wafers for photovoltaic solar cell |
 (USD) |
via email in
1-3 business day
|
VALID
|
|
| GB/T 12963-2014 |
Electronic-grade polycrystalline silicon |
 (USD) |
via email in
1-3 business day
|
VALID
|
|
| GB/T 11072-2009 |
Indium antimonide polycrystal,single crystals and as-cut slices |
 (USD) |
via email in
1-3 business day
|
VALID
|
|
| GB/T 25074-2017 |
Solar-grade polycrystalline silicon |
 (USD) |
via email in
1-3 business day
|
VALID
|
|
| GB/T 26065-2010 |
Specification for polished test silicon wafers |
 (USD) |
via email in
1-3 business day
|
VALID
|
|
| GB/T 8646-1998 |
Fine aluminum-1% silicon wire for semiconductor lend-bonding |
|
via email in
1-3 business day
|
ABOLISHED
|
please email coc@codeofchina.com for quotation
|
| GB/T 29852-2013 |
Test method for measuring phosphorus,arsenic and antimony in silicon materials used for photovoltaic applications by secondary ion mass spectrometry |
 (USD) |
via email in
1-3 business day
|
VALID
|
|
| GB/T 13387-2009 |
Test method for measuring flat length wafers of silicon and other electronic materials |
 (USD) |
via email in
1-3 business day
|
VALID
|
|
| GB/T 12962-1996 |
Monocrystalline silicon |
|
via email in
|
ABOLISHED
|
please email coc@codeofchina.com for quotation
|
| GB/T 24579-2009 |
Test method for measuring surface metal contamination of polycrystalline silicon by acid extraction-atomic absorption spectroscopy |
 (USD) |
via email in
1-3 business day
|
VALID
|
|
| GB/T 12964-2018 |
Monocrystalline silicon polished wafers |
 (USD) |
via email in
1-3 business day
|
VALID
|
|
| GB/T 4061-2009 |
Polycrystalline silicon-examination method-assessment of sandwiches on cross-section by chemical corrosion |
 (USD) |
via email in
1-3 business day
|
VALID
|
|
| YS/T 978-2014 |
Carbon/carbon composites guide shield of single crystal furnace |
 (USD) |
via email in
1 business day
|
VALID
|
|
| GB/T 13389-2014 |
Practice for conversion between resistivity and dopant density for boron-doped,phosphorus-doped,and arsenic-doped silicon |
 (USD) |
via email in
1-5 business day
|
VALID
|
|
| GB/T 12962-2005 |
Monoccrystalline silicon |
|
via email in
1-3 business day
|
ABOLISHED
|
please email coc@codeofchina.com for quotation
|
| GB/T 6620-2009 |
Test method for measuring warp on silicon slices by noncontact scanning |
 (USD) |
via email in
1-3 business day
|
VALID
|
|
| GB/T 35308-2017 |
Epitaxial wafers of germanium based Ⅲ-Ⅴcompounds for solar cell |
 (USD) |
via email in
1-3 business day
|
VALID
|
|
| GB/T 37051-2018 |
Test method for determination of crystal defect density in PV silicon ingot and wafer |
 (USD) |
via email in
1-3 business day
|
VALID
|
|
| GB/T 29054-2019 |
Casting multicrystalline silicon brick for photovoltaic solar cell |
 (USD) |
via email in
1-3 business day
|
VALID
|
|
|
|
