| Standard No. |
Title |
Price(USD) |
Delivery |
Status |
Add To Cart |
| GB/T 15431-1995 |
Generic specification for microcircuit modules |
|
via email in
1-3 business day
|
ABOLISHED
|
please email coc@codeofchina.com for quotation
|
| SJ/Z 11361-2006 |
Integrated circuit intellectual property core protection:schemes alternatives and discussion |
 (USD) |
via email in
1-3 business day
|
VALID
|
|
| GB/T 14028-1992 |
General principles of measuring methods of analogue switches for semiconductor integrated circuits |
|
via email in
1-3 business day
|
ABOLISHED
|
please email coc@codeofchina.com for quotation
|
| SJ/Z 11354-2006 |
Integrated circuit analog/mixed-signal IP core specification |
 (USD) |
via email in
1-5 business day
|
VALID
|
|
| GB/T 35010.6-2018 |
Semiconductor die products—Part 6:Requirements for concerning thermal simulation |
 (USD) |
via email in
1-3 business day
|
VALID
|
|
| SJ/T 10745-1996 |
Mechanical and climatic test methods for semiconductor integrated circuits |
 (USD) |
via email in
1-5 business day
|
|
|
| GB/T 17574.9-2006 |
Semiconductor devices - Integrated circuits - Part 2-9: Digital integrated circuits - Blank detail specification for MOS ultraviolet light erasable electrically programmable read-only memories |
|
via email in
1-3 business day
|
VALID
|
please email coc@codeofchina.com for quotation
|
| SJ 50597/60-2004 |
Semiconductor integrated circuits Detail specification for types JW117/JW150/JW138 three terminal adjustable positive voltage reference |
 (USD) |
via email in
1-5 business day
|
VALID
|
|
| GB/T 17865-1999 |
Specification for measuring depth of focus and best focus |
 (USD) |
via email in
1-3 business day
|
VALID
|
|
| GB/T 16527-1996 |
Specification for photoresist/E-beam resist for hard surface photoplates |
|
via email in
1-3 business day
|
VALID
|
please email coc@codeofchina.com for quotation
|
| GB/T 8976-1996 |
Generic specification for film integrated circuits and hybrid film integrated circuits |
|
via email in
1-3 business day
|
VALID
|
please email coc@codeofchina.com for quotation
|
| GB/T 28277-2012 |
Silicon-based MEMS fabrication technology—Measurement method of cutting and pull-press strength of micro bonding area |
 (USD) |
via email in
1-3 business day
|
VALID
|
|
| GB/T 14027.5-1992 |
Series and products of communication circuits for semiconductor integrated circuits-Products of telephone circuits |
 (USD) |
via email in
1-3 business day
|
ABOLISHED
|
|
| SJ/Z 11360-2006 |
Integrated circuit IP core signal integrity specification |
 (USD) |
via email in
1-5 business day
|
VALID
|
|
| SJ 50597/61-2005 |
Semiconductor integrated circuits detail specification for types JW1083/JW1084/JW1085/JW1086 three terminal adjustable low dropout positive voltage regulators |
 (USD) |
via email in
1-3 business day
|
VALID
|
|
| GB/T 36477-2018 |
Semiconductor integrated circuit—Measuring methods for flash memory |
 (USD) |
via email in
1-3 business day
|
VALID
|
|
| GB 6814-1986 |
Families and variety of semiconductor integrated nonlinear circuits Variety of analog switch |
 (USD) |
via email in
1-8 business day
|
ABOLISHED
|
|
| GB/T 14029-1992 |
General principles of measuring methods of analogue multiplier for semiconductor integrated circuits |
|
via email in
1-3 business day
|
VALID
|
please email coc@codeofchina.com for quotation
|
| GB/T 15879.5-2018 |
Mechanical standardization of semiconductor devices—Part 5:Recommendations applying to tape automated bonding(TAB)of integrated circuits |
 (USD) |
via email in
1-5 business day
|
VALID
|
|
| GB 11498-1989 |
Sectional specification for Film Integrated circuits and Hybrid Film Integrated circuits on the Basis of the Qualification Approval Procedure |
 (USD) |
via email in
1-3 business day
|
ABOLISHED
|
|
|
|
