| Standard No. |
Title |
Price(USD) |
Delivery |
Status |
Add To Cart |
| SJ 1532-79 |
~ |
 (USD) |
via email in
1 business day
|
VALID
|
|
| SJ 2861-1988 |
Detail specification for electronic components-Fixed power resistors-Fixed wirewound resistors for Type RXG4 Assessment level E |
 (USD) |
via email in
1 business day
|
VALID
|
|
| SJ 3237-1989 |
Method for determination of trace oxygen in electronic grade Argon-Argon ionization gas chromatography method |
 (USD) |
via email in
1-3 business day
|
|
|
| TD/T 1045-2016 |
Regulation on compiling construction standard for land consolidation and rehabilitation engineering |
|
via email in
|
VALID
|
please email coc@codeofchina.com for quotation
|
| SJ/Z 3206.9-1989 |
Methods for inspection of standard samples or sample uniformity |
 (USD) |
via email in
1-3 business day
|
|
|
| SJ 2012-1982 |
Power travelling wave tubes,Type B-211 |
 (USD) |
via email in
1-3 business day
|
|
|
| SJ 20035-1992 |
Detail specification for air dielectric tubular (piston type) trimmer variable capacitor,Model JCWG32 |
 (USD) |
via email in
1-3 business day
|
VALID
|
|
| SJ/T 10926-1996 |
Potassium silicate solution for use in electronic industry - Methods of determination of iron |
 (USD) |
via email in
1 business day
|
VALID
|
|
| SJ/T 11037-1996 |
Test method for thermal shock of electronic glass |
 (USD) |
via email in
1 business day
|
VALID
|
|
| SJ 2735-1986 |
Drawing rules for electronic products |
 (USD) |
via email in
1-10 business day
|
|
|
| SJ 2013-1982 |
Power travelling wave tubes,Type B-218 |
 (USD) |
via email in
1-3 business day
|
|
|
| SJ/T 10722-1996 |
Zircon power for use in electronic glass |
 (USD) |
via email in
1-3 business day
|
VALID
|
|
| SJ 1.3-1987 |
Development of responsibilities for lead units responsible for technical standards preparation in electronic industry |
 (USD) |
via email in
1 business day
|
VALID
|
|
| SJ 980-75 |
Gas-filled microwave switching tubes,Type RX-21 |
 (USD) |
via email in
1-3 business day
|
VALID
|
|
| SJ 3241-1989 |
Gallium arsenide single-crystal bar and wafer |
 (USD) |
via email in
1-3 business day
|
|
|
| SJ/T 10858-1996 |
Test methods for surface flatness of glass substrate and chromium film |
 (USD) |
via email in
1-3 business day
|
VALID
|
|
| SJ 2572-1985 |
Single crystal silicon rods and wafers for solar cells |
 (USD) |
via email in
1 business day
|
VALID
|
|
| SJ 378-73 |
Measurement of oscillation stability time of reflex klystron |
 (USD) |
via email in
1 business day
|
VALID
|
|
| SJ/T 10925-1996 |
Potassium silicate solution for use in electronic industry-Methods of calculation of concentration and modulus |
 (USD) |
via email in
1-3 business day
|
VALID
|
|
| SJ 453-73 |
Methods of measurement for pulse peak of rectifying current of high-voltage rectifier tubes |
 (USD) |
via email in
1 business day
|
VALID
|
|
|
|
