Standard No. |
Title |
Price(USD) |
Delivery |
Status |
Add To Cart |
GB/T 35309-2017 |
Practice for evaluation of granular polysilicon by melter-zoner and spectroscopies |
180 (USD) |
via email in
1-3 business day
|
VALID
|
|
YS/T 227.6-1994 |
Determination of copper content in tellurium--Neocuproine Chloroform extraction photometric method |
30 (USD) |
via email in
1-3 business day
|
ABOLISHED
|
|
YS/T 980-2014 |
Determination of impurities of high purity gallium oxide—Inductively coupled plasma-mass spectrmetry |
180 (USD) |
via email in
1-3 business day
|
VALID
|
|
YS/T 226.9-2009 |
Methods for chemical analysis of selenium Part 9:Determination of iron content-Flame atomic absorption spectrometry |
120 (USD) |
via email in
1-3 business day
|
VALID
|
|
YS/T 226.10-2009 |
Methods for chemical analysis of selenium Part 10:Determination of nickel content-Flame atomic absorption spectrometry |
120 (USD) |
via email in
1-3 business day
|
VALID
|
|
GB/T 37211.1-2018 |
Methods for chemical analysis of germanium metal—Part 1:Determination of arsenic content—Arsenic stain method |
120 (USD) |
via email in
1-3 business day
|
VALID
|
|
GB/T 14849.3-2020 |
Methods for chemical analysis of silicon metal—Part 3:Determination of calcium content |
180 (USD) |
via email in
1-3 business day
|
TO BE VALID
|
|
GB/T 1557-2018 |
Test method for determining interstitial oxygen content in silicon by infrared absorption |
180 (USD) |
via email in
1-3 business day
|
VALID
|
|
YS/T 226.7-2009 |
Methods for chemical analysis of selenium Part 7:Determination of magnesium content-Flame atomic absorption spectrometry |
120 (USD) |
via email in
1-3 business day
|
VALID
|
|
YS/T 519.1-2006 |
Methods for chemical analysis of arsenic The potassium bromate volumetric method for the determination of arsenic content |
30 (USD) |
via email in
1-3 business day
|
ABOLISHED
|
|
YS/T 981.1-2014 |
Methods for chemical analysis of high purity indium—Determination of magnesiumaluminumsiliconsulphurironnickelcopperzinc,arsenic,silver,cadmium,tin,thallium,lead content—High mass resolution glow discharge mass specrometry |
180 (USD) |
via email in
1-3 business day
|
VALID
|
|
GB/T 26067-2010 |
Standard test method for dimensions of notches on silicon wafers |
180 (USD) |
via email in
1-3 business day
|
VALID
|
|
YS/T 519.4-2009 |
Methods for chemical analysis of arsenic Part 4:Determination of bismuth antimony and sulfur content-Inductively coupled plasma atomic emission spectrometry |
120 (USD) |
via email in
1-3 business day
|
VALID
|
|
GB/T 37385-2019 |
Test method for chloride content of silicon—Ion chromatography method |
180 (USD) |
via email in
1-3 business day
|
VALID
|
|
YS/T 519.1-2009 |
Methods for chemical analysis of arsenic—Part 1:Determination of arsenic content—Potassium bromate titrimetric method |
120 (USD) |
via email in
1-3 business day
|
VALID
|
|
YS/T 34.1-2011 |
Method for chemical analysis of the high-purity arsenic—Inductive coupling plasma mass spectrum (ICP-MS) for determinating the concentration of elements in the high-purity arsenic |
180 (USD) |
via email in
1-3 business day
|
VALID
|
|
GB/T 4700.4-1998 |
Methods for chemical analysis of calcium-silicon- The phosphomolybdenum blue photometric method for the determination of phosphorus content |
|
via email in
1-3 business day
|
ABOLISHED
|
please email coc@codeofchina.com for quotation
|
GB 2145-1980 |
|
30 (USD) |
via email in
1-3 business day
|
ABOLISHED
|
|
YB/T 5314-2006 |
Methods for chemical analysis of calcium-silicon--The EDTA titrimetric method for the determination of aluminum content |
45 (USD) |
via email in
1-3 business day
|
ABOLISHED
|
|
GB/T 4060-2007 |
Polycrystalline silicon—Examination method—Vacuum zone-melting on boron |
120 (USD) |
via email in
1-3 business day
|
ABOLISHED
|
|
|