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GB/T 35309-2017 Practice for evaluation of granular polysilicon by melter-zoner and spectroscopies 180 (USD) via email in 1-3 business day VALID
YS/T 227.6-1994 Determination of copper content in tellurium--Neocuproine Chloroform extraction photometric method 30 (USD) via email in 1-3 business day ABOLISHED
YS/T 980-2014 Determination of impurities of high purity gallium oxide—Inductively coupled plasma-mass spectrmetry 180 (USD) via email in 1-3 business day VALID
YS/T 226.9-2009 Methods for chemical analysis of selenium Part 9:Determination of iron content-Flame atomic absorption spectrometry 120 (USD) via email in 1-3 business day VALID
YS/T 226.10-2009 Methods for chemical analysis of selenium Part 10:Determination of nickel content-Flame atomic absorption spectrometry 120 (USD) via email in 1-3 business day VALID
GB/T 37211.1-2018 Methods for chemical analysis of germanium metal—Part 1:Determination of arsenic content—Arsenic stain method 120 (USD) via email in 1-3 business day VALID
GB/T 14849.3-2020 Methods for chemical analysis of silicon metal—Part 3:Determination of calcium content 180 (USD) via email in 1-3 business day TO BE VALID
GB/T 1557-2018 Test method for determining interstitial oxygen content in silicon by infrared absorption 180 (USD) via email in 1-3 business day VALID
YS/T 226.7-2009 Methods for chemical analysis of selenium Part 7:Determination of magnesium content-Flame atomic absorption spectrometry 120 (USD) via email in 1-3 business day VALID
YS/T 519.1-2006 Methods for chemical analysis of arsenic The potassium bromate volumetric method for the determination of arsenic content 30 (USD) via email in 1-3 business day ABOLISHED
YS/T 981.1-2014 Methods for chemical analysis of high purity indium—Determination of magnesiumaluminumsiliconsulphurironnickelcopperzinc,arsenic,silver,cadmium,tin,thallium,lead content—High mass resolution glow discharge mass specrometry 180 (USD) via email in 1-3 business day VALID
GB/T 26067-2010 Standard test method for dimensions of notches on silicon wafers 180 (USD) via email in 1-3 business day VALID
YS/T 519.4-2009 Methods for chemical analysis of arsenic Part 4:Determination of bismuth antimony and sulfur content-Inductively coupled plasma atomic emission spectrometry 120 (USD) via email in 1-3 business day VALID
GB/T 37385-2019 Test method for chloride content of silicon—Ion chromatography method 180 (USD) via email in 1-3 business day VALID
YS/T 519.1-2009 Methods for chemical analysis of arsenic—Part 1:Determination of arsenic content—Potassium bromate titrimetric method 120 (USD) via email in 1-3 business day VALID
YS/T 34.1-2011 Method for chemical analysis of the high-purity arsenic—Inductive coupling plasma mass spectrum (ICP-MS) for determinating the concentration of elements in the high-purity arsenic 180 (USD) via email in 1-3 business day VALID
GB/T 4700.4-1998 Methods for chemical analysis of calcium-silicon- The phosphomolybdenum blue photometric method for the determination of phosphorus content via email in 1-3 business day ABOLISHED please email coc@codeofchina.com for quotation
GB 2145-1980 30 (USD) via email in 1-3 business day ABOLISHED
YB/T 5314-2006 Methods for chemical analysis of calcium-silicon--The EDTA titrimetric method for the determination of aluminum content 45 (USD) via email in 1-3 business day ABOLISHED
GB/T 4060-2007 Polycrystalline silicon—Examination method—Vacuum zone-melting on boron 120 (USD) via email in 1-3 business day ABOLISHED
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