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GB/T 24577-2009 Test methods for analyzing organic contaminants on silicon wafer surfaces by thermal desorption gas chromatography 240 (USD) via email in 1-3 business day VALID
GB/T 6621-2009 Testing methods for surface flatness of silicon slices 120 (USD) via email in 1-3 business day VALID
GB/T 4058-2009 Test method for detection of oxidation induced defects in polished silicon wafers 300 (USD) via email in 1-3 business day VALID
GB/T 29505-2013 Test method for measuring surface roughness on planar surfaces of silicon wafer 480 (USD) via email in 1-5 business day VALID
GB/T 26068-2010 Test method for carrier recombination lifetime in silicon wafers by non-contact measurement of photoconductivity decay by microwave reflectance 420 (USD) via email in 1-3 business day ABOLISHED
GB/T 25075-2010 Gallium arsenide single crystal for solar cell 180 (USD) via email in 1-3 business day VALID
GB/T 1558-2009 Test method for substitutional atomic carbon concent of silicon by infrared absorption 180 (USD) via email in 1-3 business day VALID
GB/T 14844-2018 Designations of semiconductor materials via email in 1-3 business day VALID please email coc@codeofchina.com for quotation
GB/T 16595-2019 Specification for a universal wafer grid 180 (USD) via email in 1-3 business day VALID
GB/T 24575-2009 Test method for measuring surface sodium,aluminum,potassium,and iron on silicon and epi substrates by secondary ion mass spectrometry 180 (USD) via email in 1-3 business day VALID
GB/T 14847-2010 Test method for thickness of lightly doped silicon epitaxial layers on heavily doped silicon substrates by infrared reflectance 180 (USD) via email in 1-3 business day VALID
GB/T 6619-2009 Test methods for bow of silicon wafers 180 (USD) via email in 1-3 business day VALID
YS/T 838-2012 Cadmium telluride 240 (USD) via email in 1-3 business day VALID
GB/T 24574-2009 Test methods for photoluminescence analysis of single crystal silicon for Ⅲ-Ⅴ impurities 240 (USD) via email in 1-3 business day VALID
YS/T 679-2008 Test methods for minority carrier diffusion length in extrinsic semiconductors by measurement of steady-steady-state surface photovoltage 240 (USD) via email in 1-3 business day ABOLISHED
GB/T 30453-2013 Metallographs collection for original defects of crystalline silicon 1320 (USD) via email in 1-10 business day VALID
GB/T 6617-2009 Test method for measuring resistivity of silicon wafer using spreading resistance probe 180 (USD) via email in 1-3 business day VALID
GB/T 1555-2009 Testing methods for determining the orientation of a semiconductor single crystal 180 (USD) via email in 1-3 business day VALID
GB/T 14141-2009 Test method for sheet resistance of silicon epitaxial,diffused and ion-implanted layers using a collinear four-probe array 180 (USD) via email in 1-3 business day VALID
GB/T 13388-2009 Method for measuring crystallographic orientation of flats on single-crystal silicon slices and wafers by X-ray techniques 180 (USD) via email in 1-3 business day VALID
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