| Standard No. |
Title |
Price(USD) |
Delivery |
Status |
Add To Cart |
| GB/T 18910.2-2003 |
Liquid crystal and solid-state display devices—Part 2:Liquid crystal display modules sectional specification |
|
via email in
1-3 business day
|
VALID
|
please email coc@codeofchina.com for quotation
|
| GB/T 4937-1995 |
Mechanical and climatic test methods for semiconductor devices |
|
via email in
1-3 business day
|
ABOLISHED
|
please email coc@codeofchina.com for quotation
|
| SJ 50033/155-2002 |
Semiconductor discrete devices Detail specification for type 3DG252 sillcon microwave linearity transistor |
 (USD) |
via email in
1-3 business day
|
VALID
|
|
| GB/T 18910.41-2008 |
Liquid crystal display devices—Part 4-1:Matrix colour LCD modules—Essential ratings and characteristics |
 (USD) |
via email in
1-3 business day
|
VALID
|
|
| GB/T 18910.22-2008 |
Liquid crystal display devices—Part 2-2: Matrix colour LCD modules—Blank detail specification |
 (USD) |
via email in
1-3 business day
|
VALID
|
|
| GB/T 4937.21-2018 |
Semiconductor devices—Mechanical and climatic test methods—Part 21:Solderability |
 (USD) |
via email in
1-3 business day
|
VALID
|
|
| GB/T 4937.12-2018 |
Semiconductor devices—Mechanical and climatic test methods—Part 12:Vibration,variable frequency |
 (USD) |
via email in
1-3 business day
|
VALID
|
|
| ZB N 05005-1988 |
|
|
via email in
|
ABOLISHED
|
please email coc@codeofchina.com for quotation
|
| GB/T 249-1989 |
The rule of type designation for discrete semiconductor |
 (USD) |
via email in
1-3 business day
|
ABOLISHED
|
|
| GB/T 20521-2006 |
Semconductor devices Part 14-1: Semiconductor sensors - General and classification |
|
via email in
1-3 business day
|
VALID
|
please email coc@codeofchina.com for quotation
|
| SJ 50033/159-2002 |
Semiconductor discrete devices Detail specification for type 3DG142 silicon UHF low-noise transistor |
 (USD) |
via email in
1-3 business day
|
VALID
|
|
| GB/T 4589.1-2006 |
Semiconductor devices - Part 10: Generic specification for discrete devices and integrated circuits |
|
via email in
1-3 business day
|
VALID
|
please email coc@codeofchina.com for quotation
|
| GB/T 4937.1-2006 |
Semiconductor devices―Mechanical and climatic test methods―Part 1: General |
 (USD) |
via email in
1-3 business day
|
VALID
|
|
| SJ 1606-1980 |
|
|
via email in
|
ABOLISHED
|
please email coc@codeofchina.com for quotation
|
| GB/T 4937.15-2018 |
Semiconductor devices—Mechanical and climatic test methods—Part 15:Resistance to soldering temperature for through-hole mounted devices |
 (USD) |
via email in
1-3 business day
|
VALID
|
|
| GB/T 4937.17-2018 |
Semiconductor devices—Mechanical and climatic test methods—Part 17:Neutron irradiation |
 (USD) |
via email in
1-3 business day
|
VALID
|
|
| SJ 1400-78 |
Letter symbols for parameters of semiconductor devices |
 (USD) |
via email in
1-5 business day
|
VALID
|
|
| GB/T 20516-2006 |
Semiconductor devices - Discrete devices - Part 4: Microwave devices |
|
via email in
1-3 business day
|
VALID
|
please email coc@codeofchina.com for quotation
|
| SJ 50033/157-2002 |
Semiconductor discrete devices Detail specification for type 3DA506 silicon microwave pulse power transistor |
 (USD) |
via email in
1-3 business day
|
VALID
|
|
| SJ 1607-1980 |
|
|
via email in
|
ABOLISHED
|
please email coc@codeofchina.com for quotation
|
|
|
