| Standard No. |
Title |
Price(USD) |
Delivery |
Status |
Add To Cart |
| GB/T 36613-2018 |
Probe test method for light emitting diode chips |
 (USD) |
via email in
1-3 business day
|
VALID
|
|
| SJ/T 11401-2009 |
Series program for semiconductor light emitting diodes |
 (USD) |
via email in
1-5 business day
|
VALID
|
|
| SJ/T 11399-2009 |
Measurement methods for chips of light emitting diodes |
 (USD) |
via email in
1-3 business day
|
VALID
|
|
| GB/T 36361-2018 |
Accelerated life test method for LED |
 (USD) |
via email in
1-3 business day
|
VALID
|
|
| GB/T 15529-1995 |
Blank detail specification for LED numeric displays |
|
via email in
1-3 business day
|
VALID
|
please email coc@codeofchina.com for quotation
|
| SJ/T 11393-2009 |
Semiconductor optoelectronic devices—Blank detail specification for power light-emitting diodes |
 (USD) |
via email in
1-3 business day
|
VALID
|
|
| GB/T 12561-1990 |
Blank detail specification for light emitting diodes |
 (USD) |
via email in
1-3 business day
|
ABOLISHED
|
|
| GB/T 36362-2018 |
Point estimation and interval estimation for reliability testing of LED applied products(exponential distribution) |
 (USD) |
via email in
1-3 business day
|
VALID
|
|
| SJ/T 11398-2009 |
Technical specification for power light-emitting diode chips |
 (USD) |
via email in
1-3 business day
|
VALID
|
|
|
|
