| Standard No. |
Title |
Price(USD) |
Delivery |
Status |
Add To Cart |
| GB 9619.1-1988 |
|
45 (USD) |
via email in
1-3 business day
|
ABOLISHED
|
|
| GB 9000.15-1988 |
|
45 (USD) |
via email in
1-3 business day
|
ABOLISHED
|
|
| GB 9620.4-1988 |
|
60 (USD) |
via email in
1-3 business day
|
ABOLISHED
|
|
| GB/T 5598-2015 |
Test method for thermal conductivity of beryllium oxide ceramics |
470 (USD) |
via email in
1 business day
|
VALID
|
|
| GB 9000.1-1988 |
|
60 (USD) |
via email in
1-3 business day
|
ABOLISHED
|
|
| GB 9620.2-1988 |
|
615 (USD) |
via email in
1-5 business day
|
ABOLISHED
|
|
| GB/T 4187-2017 |
Tungsten bars and rods |
180 (USD) |
via email in
1-3 business day
|
VALID
|
|
| GB 9620.7-1988 |
|
45 (USD) |
via email in
1-3 business day
|
ABOLISHED
|
|
| GB 11248-1989 |
Dumet wire |
105 (USD) |
via email in
1-3 business day
|
ABOLISHED
|
|
| SJ 20964-2006 |
Specification for tungsten-37 rhenium alloy |
255 (USD) |
via email in
1-3 business day
|
VALID
|
|
| GB 9474.3-1988 |
|
30 (USD) |
via email in
1-3 business day
|
ABOLISHED
|
|
| GB/T 5594.3-2015 |
Test methods for properties of structure ceramicused in electronic components and device—Part 3:Test method for mean coefficient of linear expansion |
120 (USD) |
via email in
1-3 business day
|
VALID
|
|
| SJ 20859-2002 |
Semiconductor photoelectric assembly Detail specification for miniature duplex photoelectric localizer for type CBGS 2301 |
105 (USD) |
via email in
1-3 business day
|
VALID
|
|
| GB 9622.11-1988 |
|
30 (USD) |
via email in
1-3 business day
|
ABOLISHED
|
|
| SJ/T 11319-2005 |
Quantity test method of the oxidation sludge in the tin solder |
105 (USD) |
via email in
1-3 business day
|
VALID
|
|
| GB/T 31469-2015 |
Semiconductor materials cutting fluid |
120 (USD) |
via email in
1-3 business day
|
VALID
|
|
| GB/T 36952-2018 |
Test method for surface scratch resistance of flat panel display(FPD)polarizing film |
120 (USD) |
via email in
1-3 business day
|
VALID
|
|
| GB/T 5594.8-2015 |
Test methods for properties of structure ceramic used in electronic components and device―Part 8:Test method for microstructure |
90 (USD) |
via email in
1 business day
|
VALID
|
|
| GB/T 11446.8-2013 |
Test method for total organic carbon in electronic grade water |
120 (USD) |
via email in
1-3 business day
|
VALID
|
|
| GB/T 11297.1-2017 |
Test method for wavefront distortion of laser rods |
|
via email in
1-3 business day
|
VALID
|
please email coc@codeofchina.com for quotation
|
|
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