| Standard No. |
Title |
Price(USD) |
Delivery |
Status |
Add To Cart |
| JB/T 5596-1991 |
|
 (USD) |
via email in
1-3 business day
|
|
|
| GB/T 18735-2002 |
General specification of nanometer thin STANDARD specimen for analytical transmission electron microscopy (AEM/EDS) |
|
via email in
1-3 business day
|
ABOLISHED
|
please email coc@codeofchina.com for quotation
|
| GB/T 15246-2002 |
Quantitative analysis of sulfide minerals by electron probe microanalysis |
|
via email in
1-3 business day
|
VALID
|
please email coc@codeofchina.com for quotation
|
| ZB N 33003-1988 |
|
|
via email in
|
ABOLISHED
|
please email coc@codeofchina.com for quotation
|
| JB/T 6779-1993 |
|
 (USD) |
via email in
1-3 business day
|
|
|
| JB/T 5522-1991 |
|
 (USD) |
via email in
1-3 business day
|
VALID
|
|
| GB/T 15245-1994 |
Standard method for quantitative electorn probe microanalysis of ree oxides |
 (USD) |
via email in
1-3 business day
|
ABOLISHED
|
|
| JB/T 6177-1992 |
|
 (USD) |
via email in
1-3 business day
|
|
|
| GB/T 17364-1998 |
Non-damage quantitative analysis of gold content in gold products |
|
via email in
1-3 business day
|
ABOLISHED
|
please email coc@codeofchina.com for quotation
|
| GB/T 23414-2009 |
Microbeam analysis - Scanning electron microscopy - Vocabulary |
 (USD) |
via email in
1-5 business day
|
VALID
|
|
| GB/T 20176-2006 |
Surface chemical analysis-Secondary-ion mass spectrometry-Determination of boron atomic concentration in silicon using uniformly doped materials |
|
via email in
1-3 business day
|
VALID
|
please email coc@codeofchina.com for quotation
|
| ZB N 33002.2-1988 |
|
|
via email in
|
ABOLISHED
|
please email coc@codeofchina.com for quotation
|
| JB/T 8239.2-1999 |
Specification for diffraction grating |
 (USD) |
via email in
1-3 business day
|
|
|
| GB/T 15246-1994 |
Standard method for electron probe microanalysis of sulfide minerals |
 (USD) |
via email in
1-3 business day
|
ABOLISHED
|
|
| GB/T 15616-1995 |
Qantitative method for electron probe microanalysis of metals and alloys |
|
via email in
1-3 business day
|
ABOLISHED
|
please email coc@codeofchina.com for quotation
|
| GB 7667-1996 |
The dose of X-rays leakage from electron microscope |
|
via email in
1-3 business day
|
ABOLISHED
|
please email coc@codeofchina.com for quotation
|
| ZB N 33011-1989 |
|
|
via email in
|
ABOLISHED
|
please email coc@codeofchina.com for quotation
|
| GB/T 17722-1999 |
Gold-plated thickness measurement by SEM |
|
via email in
1-3 business day
|
VALID
|
please email coc@codeofchina.com for quotation
|
| ZB N 33005-1988 |
|
 (USD) |
via email in
1-3 business day
|
ABOLISHED
|
|
| JB/T 9400-1999 |
Specificaton for X-ray diffractometer |
 (USD) |
via email in
1-3 business day
|
ABOLISHED
|
|
|
|
