| Standard No. |
Title |
Price(USD) |
Delivery |
Status |
Add To Cart |
| JC 229-1981 |
|
45 (USD) |
via email in
1-3 business day
|
ABOLISHED
|
|
| GB/T 12442-2019 |
Test method for the hydroxyl groups content of silica glass |
180 (USD) |
via email in
1-3 business day
|
VALID
|
|
| GB/T 10701-2008 |
Test methods for thermal stability of silica glass |
120 (USD) |
via email in
1-3 business day
|
VALID
|
|
| JC/T 185-1996 |
|
120 (USD) |
via email in
1-3 business day
|
ABOLISHED
|
|
| GB 4121-1983 |
The test method for stability to thermal darkening of silica glass |
45 (USD) |
via email in
1-3 business day
|
ABOLISHED
|
|
| JC/T 655-2012 |
Test methods for body stress of quartz glass products |
60 (USD) |
via email in
1-3 business day
|
VALID
|
|
| JC/T 750-1982(1996) |
The experimental method in devitrification of silica glass |
120 (USD) |
via email in
1-3 business day
|
ABOLISHED
|
|
| JC/T 597-2011 |
Transparent quartz glass tubes for semiconductor |
|
via email in
|
VALID
|
please email coc@codeofchina.com for quotation
|
| JC 181-1981(1996) |
|
30 (USD) |
via email in
1-3 business day
|
ABOLISHED
|
|
| JC/T 598-1995 |
|
120 (USD) |
via email in
1-3 business day
|
ABOLISHED
|
|
| JC/T 2064-2011 |
Transparent quartz glass rods for semiconductor |
|
via email in
|
VALID
|
please email coc@codeofchina.com for quotation
|
| GBN 225-1984 |
|
45 (USD) |
via email in
1-3 business day
|
ABOLISHED
|
|
| JC/T 597-1995 |
|
150 (USD) |
via email in
1-3 business day
|
ABOLISHED
|
|
| JC/T 652-1996 |
|
75 (USD) |
via email in
1-3 business day
|
ABOLISHED
|
|
| JC/T 751-1984(1996) |
Test method for softening point of quartz glass (wire drawing method) |
60 (USD) |
via email in
1 business day
|
VALID
|
|
| GB 5949-1986 |
Test method of alveolus and gas line in transparent silica glass |
30 (USD) |
via email in
1-3 business day
|
ABOLISHED
|
|
| JC 184-1981 |
|
30 (USD) |
via email in
1-3 business day
|
ABOLISHED
|
|
| GB/T 32661-2016 |
Spherical silica powder |
180 (USD) |
via email in
1-3 business day
|
VALID
|
|
| JC/T 2027-2010 |
Determination of impurities in high purity quartz—Inductively coupled plasma atomic emission spectrometry |
120 (USD) |
via email in
1-3 business day
|
VALID
|
|
| GBN 226-1984 |
|
45 (USD) |
via email in
1-3 business day
|
ABOLISHED
|
|
|
|
