| Standard No. |
Title |
Price(USD) |
Delivery |
Status |
Add To Cart |
| SJ/T 10329-2016 |
|
354 (USD) |
via email in
1 business day
|
VALID
|
|
| SJ/T 11584-2016 |
|
354 (USD) |
via email in
1 business day
|
VALID
|
|
| SJ/T 11585-2016 |
|
814 (USD) |
via email in
1 business day
|
VALID
|
|
| SJ/T 11586-2016 |
l0keV X-ray total dose radiation testing method of semiconductor devices |
180 (USD) |
via email in
1 business day
|
VALID
|
|
| SJ/T 11588-2016 |
|
694 (USD) |
via email in
1 business day
|
VALID
|
|
| SJ/T 11587-2016 |
Technical requirements for electrostatic discharge protective |
160 (USD) |
via email in
1 business day
|
VALID
|
|
| SJ/T 11461.2-2016 |
Organic light emitting diode displays- Part 2: Essential ratings and characteristics |
124 (USD) |
via email in
1 business day
|
VALID
|
|
| SJ/T 10709-2016 |
Generic specification for piezoelectric ceramic electro-acoustic components |
280 (USD) |
via email in
1 business day
|
VALID
|
|
| SJ/T 11591.1.1-2016 |
|
434 (USD) |
via email in
1 business day
|
VALID
|
|
| SJ/T 11461.3-2016 |
|
264 (USD) |
via email in
1 business day
|
VALID
|
|
| SJ/T 11590-2016 |
|
434 (USD) |
via email in
1 business day
|
VALID
|
|
| SJ/T 11461.4-2016 |
|
264 (USD) |
via email in
1 business day
|
VALID
|
|
| SJ/T 11591.1.2-2016 |
|
604 (USD) |
via email in
1 business day
|
VALID
|
|
| SJ/T 11589-2016 |
General specification for power station shelter of radar |
330 (USD) |
via email in
1 business day
|
VALID
|
|
| SJ/T 11591.4.1.1-2016 |
|
924 (USD) |
via email in
1 business day
|
VALID
|
|
| SJ/T 11461.5.3-2016 |
|
384 (USD) |
via email in
1 business day
|
VALID
|
|
| SJ/T 11566-2016 |
Automatically trim & forming equipment for integrated circuit (IC) |
160 (USD) |
via email in
1 business day
|
VALID
|
|
| SJ/T 11018-2016 |
Analytical methods for pure silver brazing for electron device Determination of sulphur by combustion-iodimetry |
120 (USD) |
via email in
1 business day
|
VALID
|
|
| SJ/T 2658.14-2016 |
Measuring method for semiconductor infrared-emitting diode -Part 14: Junction temperature |
100 (USD) |
via email in
1 business day
|
VALID
|
|
| SJ/T 2658.16-2016 |
Measuring method for semiconductor infrared-emitting diode Part 16: Photo-electric conversion efficiency |
80 (USD) |
via email in
1 business day
|
VALID
|
|
|
|
