Standard No. |
Title |
Price(USD) |
Delivery |
Status |
Add To Cart |
SJ 50033/61-1995 |
Semiconductor discrete device-Detail specification for Type 3DK6547 high-voltage and power switching transistor |
165 (USD) |
via email in
1-3 business day
|
VALID
|
|
SJ/T 10341.12-1993 |
Holders for anti-friction bearing die sets of fine blanking die with sliding punch-Die holders of diagonal pillar set for inlay die plate |
30 (USD) |
via email in
1-3 business day
|
VALID
|
|
SJ 431-73 |
Methods of measurement for voltages and currents of O-type backward-wave tube on per-electrodes |
30 (USD) |
via email in
1 business day
|
VALID
|
|
SJ 2329-1983 |
Generic specification for temperature change test chambers |
180 (USD) |
via email in
1 business day
|
VALID
|
|
SJ/Z 9001.25-1987 |
Basic environmental testing procedures-Part 2: Tests-Test Ec: Drop and Topple |
|
via email in
|
ABOLISHED
|
please email coc@codeofchina.com for quotation
|
SJ 669-1973 |
|
|
via email in
|
ABOLISHED
|
please email coc@codeofchina.com for quotation
|
SJ/T 11133-1997 |
Generic specification for flexible flat cables connectors |
180 (USD) |
via email in
1-3 business day
|
VALID
|
|
SJ 51065/7-2002 |
GPT004A、GPT023A、GTP029A type ordinary coaxial radio-frequency isolator detail specification for |
75 (USD) |
via email in
1-3 business day
|
VALID
|
|
SJ/T 31381-1994 |
|
30 (USD) |
via email in
1-3 business day
|
VALID
|
|
SJ/T 10764-1996 |
Information processing-Spools of printing ribbons for office machines and printing maching |
45 (USD) |
via email in
1-3 business day
|
VALID
|
|
SJ/T 31088-1994 |
Requirements of Readiness and Methods of Inspection and Assessment for ZXD-60 Silver Plating Units |
164 (USD) |
via email in
1 business day
|
VALID
|
|
SJ 20368-1993 |
Measuring methods for performance of transmitters and receivers |
390 (USD) |
via email in
1 business day
|
VALID
|
|
SJ/Z 9177-1995 |
Specifications for determination of 0. 5W, 1W, 3W metal oxide film resistors used for VCR |
220 (USD) |
via email in
1 business day
|
|
|
SJ 1829-1981 |
Detail specification silicon NPN epitaxial planar low power switching transistors, Type 3DK5 |
180 (USD) |
via email in
1 business day
|
|
|
SJ/T 10506-1994 |
Detail specification for electronic component-Fixed polystyrene film dielectric metal foil d.c. capacitors,Type CB11 Assessment level E |
135 (USD) |
via email in
1-3 business day
|
VALID
|
|
SJ 1718-1981 |
Measurement of cathode pulse current of power klystrons |
180 (USD) |
via email in
1 business day
|
|
|
SJ 20831-2002 |
Method for measurement and test of parameters of 4N infrared focal plane detector dewar assembly |
180 (USD) |
via email in
1-3 business day
|
VALID
|
|
SJ/T 31320-1994 |
Requirements of readiness and methods of inspection and assessment for cadmium electrodeposition units |
180 (USD) |
via email in
1 business day
|
|
|
SJ 20704-1998 |
General specification for electric system of scout armored vehicle |
375 (USD) |
via email in
1-3 business day
|
VALID
|
|
SJ 20321-1993 |
Capacitors, fixed, electrolytic (aluminum oxide) established reliability, Style CDK13, Detail specification for |
120 (USD) |
via email in
1 business day
|
VALID
|
|
|