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DB52/T 1104-2016 Junction-to-case thermal resistance transient test method of semiconductor devices
Standard No.: DB52/T 1104-2016 Status: VALID remind me the status change
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Standard No.: DB52/T 1104-2016
Chinese Name: 半导体器件结-壳热阻瞬态测试方法
English Name: Junction-to-case thermal resistance transient test method of semiconductor devices
Professional Classification: L40 Semiconductor discrete devices in general
ICS Classification: 31.080.01 Semiconductor devices in general
Issued by:
Issued on: 2016-04-01
Implemented on: 2016-10-01
Status: VALID
Language: English
File Format: PDF
Word Count:
Price(USD): please email coc@codeofchina.com for quotation
Delivery: via email in
DB52/T 1104-2016 The following standards are cited:
DB52/T 1104-2016 Cited by the following standards:
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