Mechanical and climatic test methods for semiconductor integrated circuits

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SJ/T 10745-1996 Mechanical and climatic test methods for semiconductor integrated circuits
Standard No.:	SJ/T 10745-1996	Status:	remind me the status change Email:
Language:	English	File Format:	PDF
Word Count:	24500 words	Price(USD):	735 (USD) remind me the price change Email:
Implemented on:	1997-01-01	Delivery:	via email in 1-5 business day
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Standard No.:	SJ/T 10745-1996
Chinese Name:	半导体集成电路机械和气候试验方法
English Name:	Mechanical and climatic test methods for semiconductor integrated circuits
Professional Classification:	C01 Technical management
Professional Classification:	SJ Professional Standard - Electronics
ICS Classification:	31.200
Issued by:
Issued on:	1996-11-20
Implemented on:	1997-01-01
Status:
Language:	English
File Format:	PDF
Word Count:	24500 words
Price(USD):	735 (USD)
Delivery:	via email in 1-5 business day

SJ/T 10745-1996 The following standards are cited：

SJ/T 10745-1996 Cited by the following standards：

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