| Standard No. |
Title |
Price(USD) |
Delivery |
Status |
Add To Cart |
| SJ/T 10536.1-1994 |
Tungsten-Thorium alloy wires |
 (USD) |
via email in
1 business day
|
VALID
|
|
| SJ 1722-1981 |
Pulsed magnetron,Type CKM-174～176 |
 (USD) |
via email in
1-3 business day
|
|
|
| SJ 2863-1988 |
Detail specificatioin for electronic components-Fixed power resistors-Fixed wirewound resistors for Type RXG6 Assessment level E |
 (USD) |
via email in
1 business day
|
VALID
|
|
| SJ/T 10142-1991 |
Test methods for complex pemittivity of dielectric material in microwave frequency band-Method for terminal open circuit of coaxial feeder |
 (USD) |
via email in
1-3 business day
|
VALID
|
|
| SJ/Z 9010.24-1987 |
Measurements of electrical properties of electronic tubes - Part 24: Methods of measurement for cathode-ray charge-storage tubes |
 (USD) |
via email in
1 business day
|
VALID
|
|
| SJ/T 10632-1995 |
Atomic-absorption spectrophotometry of impurties in clay,feldspar,magnesite,calcite,dolomite,talc,quartz for electron ceramic raw materials |
 (USD) |
via email in
1-3 business day
|
VALID
|
|
| SJ 1704-1981 |
Generic specification for power klystrons |
 (USD) |
via email in
1-3 business day
|
|
|
| SJ 20036-1992 |
Specification for Barium sodium polassium glass for military electronic devices and components |
 (USD) |
via email in
1-3 business day
|
VALID
|
|
| SJ 2869-1988 |
Detail specification for electronic components-Fixed low-power non-wirewound resistors-Fixed organic solid composition resistors for Type RS11 Assessment level E |
 (USD) |
via email in
1-3 business day
|
|
|
| SJ 1587-1980 |
Tungsten-Thorium-Rhenium wires for vacuum tubes |
 (USD) |
via email in
1 business day
|
VALID
|
|
| SJ 2595-1985 |
Method for the analysis of trace phosphorous in pure SiC14 - Method spectrophotometry |
 (USD) |
via email in
1 business day
|
VALID
|
|
| SJ/T 10897-1996 |
Determination of Co2O3 NiO and MnO2 in electronic glass - Atomic absorption method |
 (USD) |
via email in
1 business day
|
VALID
|
|
| GB/T 22900-2008 |
|
|
via email in
|
VALID
|
please email coc@codeofchina.com for quotation
|
| SJ/T 10148.4-1991 |
Preparation methods for electrical skeletons-Electric circuits diagram |
 (USD) |
via email in
1-3 business day
|
ABOLISHED
|
|
| T/CSPSTC 2-2017 |
Evaluation systems for industrial park innovation influence |
 (USD) |
via email in
1 business day
|
VALID
|
|
| SJ 2907-1987 |
Completeness,preparation and revision of design documents for household electronic products |
 (USD) |
via email in
1-10 business day
|
|
|
| SJ/T 11125-1997 |
Encapsulation materials of epoxy series for use in electronic components |
 (USD) |
via email in
1 business day
|
VALID
|
|
| SJ/T 10087.3-1991 |
Methods of chemical analysis for glass raw materials for colour pictrue tubes-Methods for chemical analysis of feldspar |
 (USD) |
via email in
1-3 business day
|
VALID
|
|
| SJ/Z 1463-1979 |
General requirements for chemical analysis of electronic ceramic materials |
 (USD) |
via email in
1 business day
|
VALID
|
|
| SJ/T 10248-1991 |
Detail specification for electronic components-Photo tube of type GD-24 (Applicable for certification) |
 (USD) |
via email in
1-3 business day
|
VALID
|
|
|
|
