| Standard No. |
Title |
Price(USD) |
Delivery |
Status |
Add To Cart |
| SJ 1.6-1987 |
Procedures and provision for submission and approval of technical standards in electronic industry |
 (USD) |
via email in
1 business day
|
VALID
|
|
| SJ/T 10090-1991 |
The methods for detemination of ZnS and CdS for use in phosphors |
 (USD) |
via email in
1-3 business day
|
VALID
|
|
| SJ 3228.4-1989 |
Determination of silicon oxide in high purity arenaceous quartz |
 (USD) |
via email in
1 business day
|
ABOLISHED
|
|
| SJ/T 10618-1995 |
Detail specification for electronic components-Fixed power resistors-Type RYG1 metal oxide film resistors Assessment level E |
 (USD) |
via email in
1-3 business day
|
VALID
|
|
| SJ 363-73 |
Measurement of reflector total current, reflector ion current and reflector leakage current of reflex klystrons |
 (USD) |
via email in
1 business day
|
VALID
|
|
| SJ 452-73 |
Methods of measurement for reverse current of high-voltage rectifier tubes |
 (USD) |
via email in
1 business day
|
VALID
|
|
| SJ 2534.4-1985 |
Test procedures for antennas-Antenna-range evaluation |
 (USD) |
via email in
1 business day
|
VALID
|
|
| SJ 441-73 |
Method of measurement for operating frequency range of O-type backward-wave tubes |
 (USD) |
via email in
1 business day
|
VALID
|
|
| SJ 362-73 |
Measurement conditions for reflex klystrons |
 (USD) |
via email in
1 business day
|
VALID
|
|
| SJ 2534.16-1987 |
Test procedures for antennas-Measurement of power-capacity |
 (USD) |
via email in
1 business day
|
VALID
|
|
| SJ 449-73 |
Methods of measurement for voltage with standing test for high-voltage rectifier tubes |
 (USD) |
via email in
1 business day
|
VALID
|
|
| SJ/T 10921-1996 |
Potassium silicate solution for use in electronic industry-Methods for determination of potassium carbonate |
 (USD) |
via email in
1-3 business day
|
VALID
|
|
| GB/T 38709-2020 |
Specification for international freight forwarding railway transport operation |
 (USD) |
via email in
1-5 business day
|
TO BE VALID
|
|
| SJ 2384-1983 |
Photomultiplier tubes, Type GDB-221 |
 (USD) |
via email in
1 business day
|
VALID
|
|
| SJ/T 10859-1996 |
Test method for chromium film and photoresist thickness of chrome blanks |
 (USD) |
via email in
1-3 business day
|
VALID
|
|
| SJ 2593-1985 |
Pure silicon tetrachloride |
 (USD) |
via email in
1 business day
|
VALID
|
|
| SJ 2867-1988 |
Detail specification for electronic components - Fixed low-power non-wirewound resistors - Fixed vitreous enamel resistors for Type RI40 Assessment level E |
 (USD) |
via email in
1 business day
|
VALID
|
|
| SJ 374-73 |
Measurement of load characteristic of reflex klystrons |
 (USD) |
via email in
1 business day
|
VALID
|
|
| SJ 20025-1992 |
Generic specification for gas snesors of metal-oxide semiconductor |
 (USD) |
via email in
1-3 business day
|
VALID
|
|
| SJ 20058-1992 |
Semiconductor discrete device-Detail specification for silicon NPN low power switching transistor of Type 3DK105 |
 (USD) |
via email in
1-3 business day
|
VALID
|
|
|
|
