| Standard No. |
Title |
Price(USD) |
Delivery |
Status |
Add To Cart |
| YS/T 227.10-1994 |
Determination of arsenic content in tellurium--n-butyl alcohol extraction arsenic-molybdenum blue photometric method |
 (USD) |
via email in
1-3 business day
|
ABOLISHED
|
|
| YS/T 34.4-1992 |
|
 (USD) |
via email in
1-3 business day
|
ABOLISHED
|
|
| GB 4700.4-1984 |
|
 (USD) |
via email in
1-3 business day
|
ABOLISHED
|
|
| GB/T 37211.2-2018 |
Methods for chemical analysis of germanium metal—Part 2:Determination of aluminium,iron,copper,nickle,lead,cadmium,magnesium,cobalt,indium,zinc content—Inductively coupled plasma mass spectrometry method |
 (USD) |
via email in
1-3 business day
|
VALID
|
|
| YS/T 34.3-1992 |
|
 (USD) |
via email in
1-3 business day
|
ABOLISHED
|
|
| GB/T 11073-2007 |
Standard method for measuring radial resistivity variation on silicon slices |
 (USD) |
via email in
1-3 business day
|
VALID
|
|
| GB/T 14849.1-2020 |
Methods for chemical analysis of silicon metal—Part 1:Determination of iron content |
 (USD) |
via email in
1-3 business day
|
TO BE VALID
|
|
| GB/T 4373.1-1984 |
Methods for chemical analysis of arsenic;The potassium bromate volumetric method for the determination of arsenic content |
 (USD) |
via email in
1-3 business day
|
ABOLISHED
|
|
| GB 2146-1980 |
|
 (USD) |
via email in
1-3 business day
|
ABOLISHED
|
|
| YS/T 226.10-1994 |
Determination of sulphur content in selenium--Distillation-reduction photometric method |
 (USD) |
via email in
1-3 business day
|
ABOLISHED
|
|
| GB/T 19921-2005 |
Test method of particles on silicon wafer surfaces |
|
via email in
1-3 business day
|
ABOLISHED
|
please email coc@codeofchina.com for quotation
|
| YS/T 1107-2016 |
Chemical analysis methods for carboxyethl-germanium sesquioxide |
 (USD) |
via email in
1-3 business day
|
VALID
|
|
| YS/T 34.2-2011 |
Method for chemical analysis of the high-purity arsenic—Predicating method for determinating the concentration of selenium |
 (USD) |
via email in
1-3 business day
|
VALID
|
|
| GB 2124-1980 |
|
 (USD) |
via email in
1-3 business day
|
ABOLISHED
|
|
| GB/T 26070-2010 |
Characterization of subsurface damage in polished compound semiconductor wafers by reflectance difference spectroscopy method |
 (USD) |
via email in
1-3 business day
|
VALID
|
|
| YB/T 5317-2006 |
Methods for chemical analysis of calcium-silicon The infrared absorption method and the combustion-potassiumiodate titration method for the determination of sulfur content |
 (USD) |
via email in
1-3 business day
|
ABOLISHED
|
|
| GB/T 4699.3-1984 |
Methods for chemical analysis of silicochromium;The molybdenum blue photometric method for the determination of phosphorus content |
 (USD) |
via email in
1-3 business day
|
ABOLISHED
|
|
| GB/T 35306-2017 |
Test method for carbon and oxygen content of single crystal silicon—Low temperature fourier transform infrared spectrometry |
 (USD) |
via email in
1-3 business day
|
VALID
|
|
| GB/T 4060-2018 |
Test method for boron content in polycrystalline silicon by vacuum zone-melting method |
 (USD) |
via email in
1-3 business day
|
VALID
|
|
| GB/T 4700.3-1984 |
Methods for chemical analysis of calcium-silicon;The EDTA titrimetric method for the determination of aluminum content |
 (USD) |
via email in
1-3 business day
|
ABOLISHED
|
|
|
|
