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GB/T 30854-2014 Gallium nitride based epitaxial layer for LED lighting (USD) via email in 1-3 business day VALID
GB/T 31092-2014 Monocrystalline sapphire ingot (USD) via email in 1-3 business day VALID
GB/T 11093-2007 Liquid encapsulated czochralski-grown gallium arsenide single crystals and as-cut slices (USD) via email in 1-3 business day VALID
GB/T 35305-2017 Monocrystalline gallium arsenide polished wafers for solar cell (USD) via email in 1 business day VALID
GB/T 20230-2006 Indium phosphide single crystal via email in 1-3 business day VALID please email coc@codeofchina.com for quotation
GB/T 30656-2014 Polished monocrystalline silicon carbide wafers (USD) via email in 1-3 business day VALID
SJ/T 11396-2009 The sapphire substrates for nitride based light-emitting diode (USD) via email in 1-3 business day
GB/T 30867-2014 Test method for measuring thickness and total thickness variation of monocrystalline silicon carbide wafers (USD) via email in 1-3 business day VALID
YS/T 792-2012 Carbon-carbon composites crucible used in single crystal furnace (USD) via email in 1-3 business day VALID
GB/T 11094-2007 Horizontal bridgman grown gallium arsenide single crystal and cutting wafer (USD) via email in 1-3 business day VALID
YS/T 988-2014 Carboxyethyl-germanium sesquioxide (USD) via email in 1 business day VALID
YS/T 13-2015 (USD) via email in 1-3 business day VALID
GB/T 11072-2009 Indium antimonide polycrystal,single crystals and as-cut slices (USD) via email in 1-3 business day VALID
YS/T 978-2014 Carbon/carbon composites guide shield of single crystal furnace (USD) via email in 1 business day VALID
GB/T 35308-2017 Epitaxial wafers of germanium based Ⅲ-Ⅴcompounds for solar cell (USD) via email in 1-3 business day VALID
GB/T 30856-2014 GaAs substrates for LED epitaxial chips (USD) via email in 1-3 business day VALID
GB/T 20229-2006 Gallium phosphide single crystal via email in 1-3 business day VALID please email coc@codeofchina.com for quotation
GB/T 36706-2018 Polycrystalline indium phosphide (USD) via email in 1-3 business day VALID
GB/T 30868-2014 Test method for measuring micropipe density of monocrystalline silicon carbide wafers—Chemically etching (USD) via email in 1-3 business day VALID
GB/T 30855-2014 GaP substrates for LED epitaxial chips (USD) via email in 1-3 business day VALID
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