| Standard No. |
Title |
Price(USD) |
Delivery |
Status |
Add To Cart |
| GB/T 12843-1991 |
General principle of measuring methods of microprocessors and peripheral interface circuits parameters for semiconductor integrated circuits |
|
via email in
1-3 business day
|
ABOLISHED
|
please email coc@codeofchina.com for quotation
|
| GB/T 32816-2016 |
Silicon-based MEMS fabrication technology—Specification for criterion of the combinationof the deep etching and bonding process |
 (USD) |
via email in
1-3 business day
|
VALID
|
|
| SJ/T 10804-2000 |
Semiconductor integrated circuits-General principles of measuring methods for level translator |
 (USD) |
via email in
1-5 business day
|
|
|
| GB/T 26112-2010 |
Micro-electromechanical system technology—General rules for the assessment of micro-mechanical parameters |
 (USD) |
via email in
1-3 business day
|
VALID
|
|
| GB/T 7092-1993 |
Outline dimensions of semiconductor integrated circuits |
|
via email in
1-3 business day
|
VALID
|
please email coc@codeofchina.com for quotation
|
| SJ 20938-2005 |
Microwave circuits -- Measuring methods for frequency converters |
 (USD) |
via email in
1-3 business day
|
VALID
|
|
| GB/T 13062-1991 |
Blank detail specification for film integrated circuits and hybrid film integrated circuits on the basis of the qualification approval procedure |
|
via email in
1-3 business day
|
ABOLISHED
|
please email coc@codeofchina.com for quotation
|
| GB/T 15297-1994 |
Mechanical and climatic test methods for microcircuit modules |
|
via email in
1-3 business day
|
ABOLISHED
|
please email coc@codeofchina.com for quotation
|
| GB/T 14030-1992 |
General principles of measuring methods of timer circuits for semiconductor integrated circuits |
|
via email in
1-3 business day
|
VALID
|
please email coc@codeofchina.com for quotation
|
| GB/T 14862-1993 |
Junction-to-case thermal resistance test methods of packages for semiconductor integrated circuits |
|
via email in
1-3 business day
|
VALID
|
please email coc@codeofchina.com for quotation
|
| GB/T 15879.4-2019 |
Mechanical standardization of semiconductor devices—Part 4:Coding system and classification into forms of package outlines for semiconductor device packages |
 (USD) |
via email in
1-3 business day
|
VALID
|
|
| GB/T 36614-2018 |
Integrated circuits—Memory devices pin configuration |
 (USD) |
via email in
1-3 business day
|
VALID
|
|
| GB/T 14031-1992 |
General principles of measruing methods of analogue phase-loop for semiconductor integrated circuits |
|
via email in
1-3 business day
|
VALID
|
please email coc@codeofchina.com for quotation
|
| GB/T 19248-2003 |
Test method for measuring the resistance of package leads |
|
via email in
1-3 business day
|
VALID
|
please email coc@codeofchina.com for quotation
|
| GB/T 35010.7-2018 |
Semiconductor die products—Part 7:XML schema for data exchange |
 (USD) |
via email in
1-5 business day
|
VALID
|
|
| GB/T 16464-1996 |
Semiconductor devices Integrated circuits Part 1: General |
|
via email in
1-3 business day
|
VALID
|
please email coc@codeofchina.com for quotation
|
| SJ 2817-1987 |
|
 (USD) |
via email in
1-3 business day
|
ABOLISHED
|
|
| ZBBZH/ZS |
|
|
via email in
|
VALID
|
please email coc@codeofchina.com for quotation
|
| SJ/T 10741-2000 |
Semiconductor integrated circuits-General principles of measuring methods for CMOS circuits |
 (USD) |
via email in
1-5 business day
|
|
|
| SJ 20961-2006 |
General principles of measuring methods of A/D and D/A converters for integrated circuits |
 (USD) |
via email in
1-5 business day
|
VALID
|
|
|
|
