| Standard No. |
Title |
Price(USD) |
Delivery |
Status |
Add To Cart |
| SJ 2214.9-1982 |
Method of measurement for pulse rise and fall time of semiconductor photodiodes and phototransistors |
184 (USD) |
via email in
1 business day
|
ABOLISHED
|
|
| SJ/T 31426-1994 |
Requirements of Readiness and Methods of Inspection and Assessment for Car-type Heat Treatment Furnaces |
45 (USD) |
via email in
1 business day
|
ABOLISHED
|
|
| SJ 50033/95-1995 |
Semiconductor discrete devices-Detail specification for Type 3DG144 NPN silicon high-frequency low-noise low-power transistor |
180 (USD) |
via email in
1 business day
|
VALID
|
|
| SJ 3013-1988 |
Combined dies-Square pillar sets |
30 (USD) |
via email in
1 business day
|
VALID
|
|
| SJ/Z 9140.4-1987 |
Sound system equipment-Part 10: Programme level meters |
135 (USD) |
via email in
1-3 business day
|
|
|
| SJ/T 10345.5-1993 |
Table for life tests--Table for г(1+1/m) values |
|
via email in
|
ABOLISHED
|
please email coc@codeofchina.com for quotation
|
| SJ/T 10192-1991 |
Weather radar for Type 714 |
435 (USD) |
via email in
1-3 business day
|
|
|
| SJ 20931-2005 |
General specification for microwave signal generators |
465 (USD) |
via email in
1-5 business day
|
VALID
|
|
| SJ 50973/47-2008 |
|
|
via email in
|
VALID
|
please email coc@codeofchina.com for quotation
|
| SJ/Z 9094.7-1987 |
Methods of measurement for equipment used in terrestrial radio-relay systems-Part 2: Measurements for sub-systems-Setion 6:Diversity, twin-path and hot stand-by equipment |
270 (USD) |
via email in
1-3 business day
|
ABOLISHED
|
|
| SJ 2554-1984 |
Methods for measurement of phase-shift for waveguides and coaxial components |
370 (USD) |
via email in
1 business day
|
VALID
|
|
| SJ/Z 9036-1987 |
Electrical and electronic measuring and testing equipment |
1125 (USD) |
via email in
1-8 business day
|
|
|
| SJ 2093-1982 |
Detail specification for N channel junction field-effect low power switching transistors, Type CS36 |
180 (USD) |
via email in
1 business day
|
|
|
| SJ 3244.2-1989 |
Methods of measurement for crystal lattice mismatch between substrate of Gallium arsenide and Indium phosphide and extended layer of heterojunction |
75 (USD) |
via email in
1-3 business day
|
|
|
| SJ 1225-77 |
Detail specification for germanium detector diodes,Type 2AP11~2AP17 |
60 (USD) |
via email in
1 business day
|
VALID
|
|
| SJ/T 10786-1996 |
Detail specification for electronic components-Fixed polythylene-terephthalate film dielectric metal foil d.c. capacitors for Type CL11 Assessment level E (Applicable for certific |
100 (USD) |
via email in
1 business day
|
VALID
|
|
| SJ 1143-1977 |
Low noise travelling wave tubes,Type B-101 |
210 (USD) |
via email in
1 business day
|
VALID
|
|
| SJ/Z 2015-1982 |
General rules for control charts |
60 (USD) |
via email in
1-3 business day
|
ABOLISHED
|
|
| SJ 1002-1975 |
Double acting drawing die on press - Following drawing blank holders |
150 (USD) |
via email in
1 business day
|
VALID
|
|
| SJ 343-73 |
Generic specification for gas-filled microwave switching tubes |
120 (USD) |
via email in
1 business day
|
VALID
|
|
|
|
