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GB/T 1555-2009 Testing methods for determining the orientation of a semiconductor single crystal
Standard No.: GB/T 1555-2009 Status: VALID remind me the status change
Language: English File Format: PDF
Word Count: 6000 words Price(USD): (USD) remind me the price change
Implemented on: 2010-06-01 Delivery: via email in 1-3 business day
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Standard No.: GB/T 1555-2009
Chinese Name: 半导体单晶晶向测定方法
English Name: Testing methods for determining the orientation of a semiconductor single crystal
Professional Classification: H80 Semimetal and semiconductor material in general
Professional Classification: GB National Standard
ICS Classification: 29.045 Semiconducting materials
Issued by:
Issued on: 2009-10-30
Implemented on: 2010-06-01
Status: VALID
Replace:GB/T1555-1997 Test methods for determining the orientation of a semiconductor single crystal
Language: English
File Format: PDF
Word Count: 6000 words
Price(USD): (USD)
Delivery: via email in 1-3 business day
GB/T 1555-2009 The following standards are cited:
GB/T 1555-2009 Cited by the following standards:
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