| Standard No. |
Title |
Price(USD) |
Delivery |
Status |
Add To Cart |
| GB/T 30861-2014 |
Germanium substrate for solar cell |
 (USD) |
via email in
1-3 business day
|
VALID
|
|
| GB/T 37053-2018 |
|
 (USD) |
via email in
1-3 business day
|
VALID
|
|
| GB/T 5238-2019 |
Monocrystalline germanium and monocrystalline germanium slices |
 (USD) |
via email in
1-3 business day
|
VALID
|
|
| GB/T 24577-2009 |
Test methods for analyzing organic contaminants on silicon wafer surfaces by thermal desorption gas chromatography |
 (USD) |
via email in
1-3 business day
|
VALID
|
|
| GB/T 6621-2009 |
Testing methods for surface flatness of silicon slices |
 (USD) |
via email in
1-3 business day
|
VALID
|
|
| GB/T 4058-2009 |
Test method for detection of oxidation induced defects in polished silicon wafers |
 (USD) |
via email in
1-3 business day
|
VALID
|
|
| GB/T 12965-2005 |
Monocrystalline silicon as cut slices and lapped slices |
|
via email in
1-3 business day
|
ABOLISHED
|
please email coc@codeofchina.com for quotation
|
| YS/T 43-2011 |
High-purity arsenic |
 (USD) |
via email in
1-3 business day
|
VALID
|
|
| YS/T 28-1992 |
|
 (USD) |
via email in
1-3 business day
|
ABOLISHED
|
|
| GB/T 30854-2014 |
Gallium nitride based epitaxial layer for LED lighting |
 (USD) |
via email in
1-3 business day
|
VALID
|
|
| YS/T 43-1992 |
|
 (USD) |
via email in
1-3 business day
|
ABOLISHED
|
|
| GB/T 12965-2018 |
Monocrystalline silicon as cut wafers and lapped wafers |
 (USD) |
via email in
1-3 business day
|
VALID
|
|
| GB/T 29505-2013 |
Test method for measuring surface roughness on planar surfaces of silicon wafer |
 (USD) |
via email in
1-5 business day
|
VALID
|
|
| GB/T 26068-2010 |
Test method for carrier recombination lifetime in silicon wafers by non-contact measurement of photoconductivity decay by microwave reflectance |
 (USD) |
via email in
1-3 business day
|
ABOLISHED
|
|
| GB/T 25074-2010 |
Solar-grade polycrystalline silicon |
 (USD) |
via email in
1-3 business day
|
ABOLISHED
|
|
| YS/T 977-2014 |
Carbon/carbon composites heat insulation cylinder of single crystal furnace |
 (USD) |
via email in
1-3 business day
|
VALID
|
|
| GB/T 19199-2003 |
Test method for carbon concentration of semi-insulating monocrystal gallium arsenide by measurement infrared absorption method |
 (USD) |
via email in
1-3 business day
|
ABOLISHED
|
|
| GB/T 25075-2010 |
Gallium arsenide single crystal for solar cell |
 (USD) |
via email in
1-3 business day
|
VALID
|
|
| YS/T 224-1994 |
Thallium |
 (USD) |
via email in
1-3 business day
|
ABOLISHED
|
|
| GB/T 31092-2014 |
Monocrystalline sapphire ingot |
 (USD) |
via email in
1-3 business day
|
VALID
|
|
|
|
