Specification for polished test silicon wafers

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GB/T 26065-2010 Specification for polished test silicon wafers
Standard No.:	GB/T 26065-2010	Status:	VALID remind me the status change Email:
Language:	English	File Format:	PDF
Word Count:	10000 words	Price(USD):	300 (USD) remind me the price change Email:
Implemented on:	2011-10-01	Delivery:	via email in 1-3 business day
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Standard No.:	GB/T 26065-2010
Chinese Name:	硅单晶抛光试验片规范
English Name:	Specification for polished test silicon wafers
Professional Classification:	H80 Semimetal and semiconductor material in general
ICS Classification:	29.045 Semiconducting materials
Issued by:
Issued on:	2011-01-10
Implemented on:	2011-10-01
Status:	VALID
Language:	English
File Format:	PDF
Word Count:	10000 words
Price(USD):	300 (USD)
Delivery:	via email in 1-3 business day

GB/T 26065-2010 The following standards are cited：

GB/T 26065-2010 Cited by the following standards：

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