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GB/T 6624-2009 Standard method for measuring the surface quality of polished silicon slices by visual inspection
Standard No.: GB/T 6624-2009 Status: VALID remind me the status change
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Standard No.: GB/T 6624-2009
Chinese Name: 硅抛光片表面质量目测检验方法
English Name: Standard method for measuring the surface quality of polished silicon slices by visual inspection
Professional Classification: H80 Semimetal and semiconductor material in general
Professional Classification: GB National Standard
ICS Classification: 29.045 Semiconducting materials
Issued by:
Issued on: 2009-10-30
Implemented on: 2010-06-01
Status: VALID
Replace:GB/T6624-1995 Standard method for measuring the surface quality of polished silicon slices by visual inspection
Language: English
File Format: PDF
Word Count:
Price(USD): please email coc@codeofchina.com for quotation
Delivery: via email in
GB/T 6624-2009 The following standards are cited:
GB/T 6624-2009 Cited by the following standards:
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