Standard method for measuring the surface quality of polished silicon slices by visual inspection

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GB/T 6624-2009 Standard method for measuring the surface quality of polished silicon slices by visual inspection
Standard No.:	GB/T 6624-2009	Status:	VALID remind me the status change Email:
Language:	English	File Format:	PDF
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Implemented on:	2010-06-01	Delivery:	via email in
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Standard No.:	GB/T 6624-2009
Chinese Name:	硅抛光片表面质量目测检验方法
English Name:	Standard method for measuring the surface quality of polished silicon slices by visual inspection
Professional Classification:	H80 Semimetal and semiconductor material in general
Professional Classification:	GB National Standard
ICS Classification:	29.045 Semiconducting materials
Issued by:
Issued on:	2009-10-30
Implemented on:	2010-06-01
Status:	VALID
Replace:	GB/T6624-1995 Standard method for measuring the surface quality of polished silicon slices by visual inspection
Language:	English
File Format:	PDF
Word Count:
Price(USD):	please email coc@codeofchina.com for quotation
Delivery:	via email in

GB/T 6624-2009 The following standards are cited：

GB/T 6624-2009 Cited by the following standards：

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