| Standard No. |
Title |
Price(USD) |
Delivery |
Status |
Add To Cart |
| SJ 1.9-1987 |
Principles and procedures for return of submitted standards drafts for approval |
 (USD) |
via email in
1 business day
|
VALID
|
|
| SJ/T 10732-1996 |
Type designation system for electronic tubes |
 (USD) |
via email in
1-3 business day
|
ABOLISHED
|
|
| SB/T 10723-2012 |
Valuation standard for ready-mixed mortar and equipment enterprises |
 (USD) |
via email in
1-3 business day
|
VALID
|
|
| SJ 1438-78 |
Pulsed magnetron, Type CKM-114 |
 (USD) |
via email in
1 business day
|
VALID
|
|
| SJ 440-73 |
Method of measurement for grid cut-off voltage of O-type backward-wave tubes |
 (USD) |
via email in
1 business day
|
VALID
|
|
| SJ/Z 734-1973 |
Preferred series and types for receiving tubes |
 (USD) |
via email in
1 business day
|
VALID
|
|
| SJ 3253-1989 |
General requirements of inspection procedures for preparation of measuring equipment in electronic industry |
 (USD) |
via email in
1 business day
|
VALID
|
|
| GB/T 33290.17-2016 |
Specification for inspecting exit cultural relics—Part 17:Snuff bottle and fan |
 (USD) |
via email in
1-3 business day
|
VALID
|
|
| SJ 20030-1992 |
Generic specification of vacuum capacitors |
 (USD) |
via email in
1-3 business day
|
VALID
|
|
| SJ/T 10930-1996 |
Potassium silicate solution for use in electronic industry - Methods for determination of chlorite |
 (USD) |
via email in
1 business day
|
VALID
|
|
| T/CEC 181-2018 |
Electric power enterprise standardization—Evaluation and improvement |
|
via email in
1 business day
|
VALID
|
please email coc@codeofchina.com for quotation
|
| SJ 1575-1980 |
O-type backward wave oscillators,Type BB-1A |
 (USD) |
via email in
1-3 business day
|
|
|
| SJ 436-73 |
Method of measurement for frequency pushing figure of O-type backward-wave tubes |
 (USD) |
via email in
1 business day
|
VALID
|
|
| T/TMAC 020.F-2020 |
Service specification for science and technology achievements evaluation institutions |
 (USD) |
via email in
1-3 business day
|
VALID
|
|
| SJ/T 10553-1994 |
Method of emission spectrochemical analysis of impurities in ZrO2 for use in electron ceramics |
 (USD) |
via email in
1 business day
|
VALID
|
|
| SJ/Z 1122-76 |
Preferred series and types of fluorescent display tubes |
 (USD) |
via email in
1 business day
|
VALID
|
|
| SJ/T 10781-1996 |
Detail specification for electronic components-Colour picture tubes,Type 37SX101Y22-DC01 |
 (USD) |
via email in
1-3 business day
|
|
|
| SJ 1551-79 |
Method of measurement for resistivity of silicon epitaxial layer (capacitance-voltage method) (Provisional) |
 (USD) |
via email in
1-3 business day
|
|
|
| SJ/T 10677-1995 |
Nickel oxide powder for electronic industry |
 (USD) |
via email in
1-3 business day
|
VALID
|
|
| SJ/T 10087.7-1991 |
Methods of chemical analysis for glass raw materials for colour picture tubes - Methods for chemical analysis of Sodium fluorosilicate |
 (USD) |
via email in
1 business day
|
VALID
|
|
|
|
