| Standard No. |
Title |
Price(USD) |
Delivery |
Status |
Add To Cart |
| SJ/T 10141-1991 |
Terms for cryelectronics |
 (USD) |
via email in
1 business day
|
VALID
|
|
| SJ/T 10624-1995 |
Methods of life test for X-ray tubes |
 (USD) |
via email in
1-3 business day
|
VALID
|
|
| SJ 1397-1978 |
Methods of measurement for decaying characteristic of gas discharge noise tubes |
 (USD) |
via email in
1 business day
|
VALID
|
|
| SJ 1287-77 |
Electronic tubes,Type FU-101F and F-101Z |
 (USD) |
via email in
1 business day
|
VALID
|
|
| SJ 20053-1992 |
General specification of mechanical and physical design and manufacturing for military electronic equipments |
 (USD) |
via email in
1-3 business day
|
VALID
|
|
| SJ/T 10191-1991 |
Weather radar for Type 713 |
 (USD) |
via email in
1-5 business day
|
|
|
| SJ/Z 1465-79 |
Method of chemical analysis of ceramic blank |
 (USD) |
via email in
1 business day
|
VALID
|
|
| SJ 1052-76 |
Reflex klystrons,Type K-20 |
 (USD) |
via email in
1 business day
|
VALID
|
|
| SJ 959-75 |
Figure symbols for electrode connection diagrams of cathode-ray tubes |
 (USD) |
via email in
1 business day
|
VALID
|
|
| SJ/T 11015-1996 |
Methods of analysis for pure silver brazing for electronic devices - Determination of iron (spectrophotometric-O-phenanthroline method) |
 (USD) |
via email in
1 business day
|
ABOLISHED
|
|
| SJ/T 11126-1997 |
Encapsulation materials of phenolic series for use in electronic components |
 (USD) |
via email in
1 business day
|
VALID
|
|
| SJ 2758-1987 |
Method of measurement by infrared interference for thickness of homoepitaxial layers |
 (USD) |
via email in
1-3 business day
|
|
|
| SJ 20059-1992 |
Semiconductor discrete device-Detail specification for silicon NPN high-frequency low power transistor of Type 3DG111 |
 (USD) |
via email in
1-3 business day
|
VALID
|
|
| SJ/Z 734-73 |
Preferred series and types for receiving tubes |
 (USD) |
via email in
1-3 business day
|
VALID
|
|
| SJ 344-73 |
General specification for low noise travelling wave tubes |
 (USD) |
via email in
1 business day
|
VALID
|
|
| SJ 366-73 |
Measurement of interelectrode leakage current of reflex klystrons |
 (USD) |
via email in
1 business day
|
VALID
|
|
| SJ 444-73 |
Methods of measurement for anode current and anode current on underheated condition of high-voltage rectifier tubes |
 (USD) |
via email in
1 business day
|
VALID
|
|
| SJ/T 10573-1994 |
Detail specification for electronic components-Fixed precision resistors,Type RJ75 metal film precision resistors Assessment level E |
 (USD) |
via email in
1-3 business day
|
VALID
|
|
| SJ 3228.7-1989 |
Determination of Chromium in high purity arenaceous quartz |
 (USD) |
via email in
1-3 business day
|
ABOLISHED
|
|
| GB/T 33290.13-2016 |
Specification for inspecting exit cultural relics—Part 13:Weapon |
 (USD) |
via email in
1-3 business day
|
VALID
|
|
|
|
