| Standard No. |
Title |
Price(USD) |
Delivery |
Status |
Add To Cart |
| YS/T 617.2-2007 |
Determination of chemical compositions and physical properties of aluminum powder magnesium powder and Al-Mg alloy powder Part 2 Determination of aluminum content of Al-Mg alloy powders Fluoride replacement-complexometric method |
|
via email in
1-3 business day
|
VALID
|
please email coc@codeofchina.com for quotation
|
| GB/T 17473.3-1998 |
Test methods of precious metal pastes used for thick film microelectronics--Determination of sheet resistance |
|
via email in
1-3 business day
|
ABOLISHED
|
please email coc@codeofchina.com for quotation
|
| GB/T 32282-2015 |
Test method for dislocation density of GaN single crystal—Cathodoluminescence spectroscopy |
180 (USD) |
via email in
1-3 business day
|
VALID
|
|
| GB/T 11107-2018 |
Metallic and its compound powder—Determination of specific surface and particle size—Air permeating method |
180 (USD) |
via email in
1-3 business day
|
VALID
|
|
| YS/T 535.8-2009 |
Chemical analysis methods of sodium fluoride—Part 8:Determination of water insoluble matter content—Gravimetric method |
120 (USD) |
via email in
1-3 business day
|
VALID
|
|
| YB 799-1971 |
|
|
via email in
|
|
please email coc@codeofchina.com for quotation
|
| YS/T 581.12-2006 |
Determination of chemical contents and physical properties of aluminium fluoride Part 12: Determination of size distribution -- Sieving method |
60 (USD) |
via email in
1-3 business day
|
VALID
|
|
| GB/T 32188-2015 |
Test method for full width at half maximum of double crystal X-ray rocking curve of GaN single crystal substrate |
180 (USD) |
via email in
1-3 business day
|
VALID
|
|
| GB/T 26068-2018 |
Test method for carrier recombination lifetime in silicon wafers and silicon ingots—Non-contact measurement of photoconductivity decay by microwave reflectance method |
480 (USD) |
via email in
1-5 business day
|
VALID
|
|
| JB/T 7131-2002 |
Standard test method for cross curvature of thermostat metals |
|
via email in
1-3 business day
|
VALID
|
please email coc@codeofchina.com for quotation
|
| YS/T 1161.1-2016 |
Chemical analysis methods of pseudoboehmite—Part 1:Determination of gelation index—EDTA titrimetric method |
120 (USD) |
via email in
1-3 business day
|
VALID
|
|
| GB/T 4104-1983 |
Leucoscopic method for testing whiteness of zinc oxide made by direct process |
30 (USD) |
via email in
1-3 business day
|
ABOLISHED
|
|
| GB/T 351-1995 |
Metallic materials—Resistivity measurement method |
90 (USD) |
via email in
1-3 business day
|
ABOLISHED
|
|
| YS/T 581.4-2006 |
Determination of chemical contents and physical properties of aluminium fluoride Part 4:Determination of aluminium by the EDTA volumetric method |
75 (USD) |
via email in
1-3 business day
|
VALID
|
|
| GB 11107-1989 |
Metallic and its compound powder-Determination of specific surface and particle size by air permeating method |
90 (USD) |
via email in
1-3 business day
|
ABOLISHED
|
|
| YS/T 23-2016 |
Test method for thickness of epitaxial layers—Stacking fault size |
180 (USD) |
via email in
1-3 business day
|
VALID
|
|
| GB/T 11110-1989 |
Anodizing of aluminium and its alloys-Determination of quality of sealed anodic oxide coating-Admittance test |
|
via email in
1-3 business day
|
ABOLISHED
|
please email coc@codeofchina.com for quotation
|
| GB/T 30860-2014 |
Test methods for surface roughness and saw mark of silicon wafers for solar cells |
240 (USD) |
via email in
1-3 business day
|
VALID
|
|
| GB/T 6618-1995 |
Test method for thickness and total thickness variation of silicon slices |
|
via email in
1-3 business day
|
ABOLISHED
|
please email coc@codeofchina.com for quotation
|
| YB/T 5338-2006 |
Retained austenite in steel -- Quantitative deternination -- Method of X-ray diffractometer |
60 (USD) |
via email in
1-3 business day
|
ABOLISHED
|
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